3C-SiC薄膜的外延生长一直是SiC材料制备领域的一个热点,单晶Si衬底异质外延3C-SiC是实现大尺寸、低成本薄膜的有效方法,备受人们关注.单晶Si与3C-SiC之间存在较大的晶格失配(20％)和热膨胀系数差异(8％),严重制约着高质量单晶薄膜的制备.本文对单晶Si衬底异质外延3C-SiC薄膜的基本原理和工艺过程进行了总结,着重介绍了薄膜生长中的缺陷和可控掺杂方面的研究进展以及面临的挑战,并对今后的研究热点做了归纳展望.
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