通过调研国内外多层陶瓷元件界面的研究现状,并结合自身工作,分析了在制备过程中多层陶瓷元件界面所存在的关键问题及其难点:共烧匹配性、扩散、结合性能等,提出了相应的控制措施,展望了其发展方向.并介绍了主导烧结曲线(MSC)、有限成分法(FEM)等相关的理论模型.这些都是有效控制界面品质,获得高性能多层陶瓷元件的关键.
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