利用同步辐射X射线形貌术对升华法生长的6H-SiC(0001)晶片中的小角晶界与微管缺陷进行了研究.小角晶界在同步辐射中的形貌成直线沿〈11- 00〉方向分布.根据螺位错附近的应变场和衍射几何,模拟了基本Burgers矢量大小的螺位错在同步辐射形貌像中的衍衬像,模拟结果与实验结果符合较好.据此指认了基本螺位错,并确定了微管Burgers矢量的大小.
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