介绍了一种用于测量薄膜样品和高压样品比热的一种芯片式量热计，该器件由美国加州大学伯克利分校的Frances Hellman研究组于15年前最先开发研制并投入使用，但其应用在中国尚未见报道。希望此文能为国内相关领域的研究人员起到抛砖引玉的作用。
“Calorimetry on a chip” technique for measurement of specific heat of thin film and high pressure sample is introduced. This technique was developed and put into application by the Frances Hellman research group at UC Berkeley 15 years ago. However, application of this technique in our country has not been reported yet. This paper aims at familiarising researchers in our country with this technique.
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