讨论了俄歇能谱仪分析壁垒型铝阳极氧化膜成份的一些技术问题。配合氩离子溅射深度成份分析、离子注入标记氙原子、膜剖面超薄切片的透射电子显微镜观察,证实了壁垒型阳极氧化膜一般由内、外两层组成。外层是向膜外迁移的铝离子在膜与电解质溶液的界面上形成的;内层则是向膜内迁移的含氧离子在膜与基体界面上形成的。电解质溶液的离子会结合在膜中,并在电场影响下发生漂移。测出了存选定的实验条件下,膜中电解质离子的平均漂移速度。
Some technical problems concerning the analysis of qarrier anodic films on aluminium by AES were discussed. By ion implantation of Xe marker, composition profiling along with direct observation of ultramicrotomed film sections, it has been proved that the barrier film is usually composed of two layers. The outer layer is formed by outwardly migrating aluminium ions at the film/solution interface. The inner layer, on the other hand, is formed by inwardly migrating oxygen-containing ions at the film/substrate interface. Ions characterizing the electrolyte may be incorporated into the film and migrate under the high electric field within the film. The average migration rate under the experimental conditions was measured.
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