材料期刊网

用X射线衍射,示差扫描量热和电阻测量技术研究了Cu_(0·60)Ti_(0·40)金属玻璃的电学性质和结晶.发现Cu_(0·60)Ti_(0·40)金属玻璃有负的电阻温度系数,随着结晶过程的进行,电阻温度系数变为正值并逐渐增大.Cu_(0·60)Ti_(0·40)金属玻璃的结晶过程有两个阶段并基本上符合J-M-A方程.用不同方法计算了它的结晶活化能,所得数值彼此接近.指出还存在较大的潜力来提高Cu-Ti系金属玻璃的稳定性.

The electrical properties and crystallization of Cu_(0.60)Ti_(0.40)metallic glass wereinvestigated by X-ray diffraction,DSC technique and electrical resistance measure-ment under isothermal and isochronal heating conditions.A negative temperaturecoefficient of electrical resistivity of the metallic glass Cu_(0.60)Ti_(0.40)is presented,andit becomes positive and increasing value in process of crystallization.Its crystal-lization is shown in two stages and in conformity with he J-M-A equationbasically.A good mutual couforment about the activation energies of crystalliza-tion was made with calculation by various methods.It seems that there is agreat potentiality in the increase of the stability of Cu-Ti metallic glass.