应用纳米压痕法测量残余应力的2种理论模型对5种电沉积镍镀层中的残余应力在不同压痕深度处进行了测量,并与X射线衍射法的测量结果进行了比较.结果表明,压深位于薄膜/基底界面处的2种压痕法测量结果与X射线衍射法的测量结果相近,且Yun-Hee模型与其符合得更好.
参考文献
[1] | Tsui T.Y.;Oliver W.C. .Influences of stress on the measurement of mechanical properties using nanoindentation: Part I. Experimental studies in an aluminum alloy[J].Journal of Materials Research,1996(3):752-759. |
[2] | Bolshakov A;Oliver W C;Pharr G M .Influences of stress on the measurement of mechanical properties using nanoindentation:Part Ⅱ Finite element simulations[J].Journal of Materials Research,1996,11(03):760. |
[3] | Carlsson S;Larsson P L .On the determination of residual stress and strain fields by sharp indentation testing.Part Ⅰ Theoretical and numerical analysis[J].Acta Materials,2001,49:2179. |
[4] | Carlsson S;Larsson P L .On the determination of residual stress and strain fields by sharp indentation testing.Part Ⅱ Experimental investigation[J].Acta Materials,2001,49:2193. |
[5] | S.Suresh;A.E.Glannakopoulos .A new method for estimating residual stresses by instrumented sharp indentation[J].Acta materialia,1998(16):5755-5768. |
[6] | Yun-Hee;Dongil Kwon .Measurement of residual-stress effect by nanoindentation on elastically strained (100)W[J].Scripta Materialia,2003,49:459. |
[7] | Yun-Hee Lee;Dongil Kwon .Estimation of biaxial surface stress by instrumented indentation with sharp indenters[J].Acta materialia,2004(6):1555-1563. |
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