以非晶锆基金属玻璃薄带制备透射电子显微镜样品,并利用透射电镜找到在弯曲样品过程中产生的剪切带.高分辨透射电镜技术揭示在剪切带中存在着纳米级的空洞类和高密度区域缺陷.这些缺陷被认为是在机械负载和外应力移除过程中应力激发的自由体积演化而成的,其演化过程可以通过和在相同的金属玻璃样品上的热退火过程作类比来定性地理解.
Transmission electron microscopy (TEM) specimens of Zr-based metallic glasses were prepared from amorphous ribbons. Shear bands produced by bending these specimens were located by TEM. High resolution transmission electron microscopy analysis indicates the existence of nanoscale void-like defects and high-density areas in shear bands. The formation of these defects is believed resulting from the evolution of stress-activated free volumes during the mechanical loading and the removal of external stress, which can be understood by comparing the stress-induced processes in shear bands in analogy with the thermal annealing effects on similar metallic glasses.
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