近年来,Si基ZnO∶ Al透明导电薄膜界面处Si的渗透对薄膜性能的影响引起了人们的关注.本文采用射频磁控溅射法,在石英和Si衬底上沉积了不同厚度的Al、Si弱掺杂(1 wt.%)的ZnO薄膜(AZO∶ Si),系统研究了膜厚(等价于Si的渗透深度)对薄膜电学、光学性质的影响.结果显示,膜厚在几十nm时,薄膜的电阻率、载流子浓度和迁移率都强烈地依赖于膜厚,在膜厚为19nm时,载流子浓度和迁移率接近最小,电阻率较大,且呈现p型导电特性.随着膜厚增加,载流子浓度和迁移率都变大,电阻率减小并趋于稳定,膜厚在396nm附近时电阻率最小是7× 10-3Ω ·cm,此时的载流子浓度和迁移率分别是1.54×1020cm-3和5.66 cm2V-1s-1.膜厚达300nm以上时,Si的影响已可忽略.结合薄膜的X射线衍射(XRD)图谱、X射线光电子能谱(XPS)和紫外—可见光(UV-Vis)透射光谱探讨了膜厚(Si的渗透深度或过渡层厚度)对薄膜性能的影响及其相关机制.
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