通过坩埚下降法制备了单晶锌,同时采用XRD分析了所生长锌单晶体的取向,并应用循环伏安法对比研究了单晶体解理面、单晶表面偏离晶面以及多晶体的电化学性能.分析了锌单晶生长的主要工艺参数,并从理论上初步讨论了其影响因素.循环伏安图表明,单晶体电极的循环可逆性比多晶体更好,锌单晶电极的活性比多晶体要小,因此还原时电沉积电流密度比多晶体低.
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