为了进一步弄清AZ31镁合金阳极氧化膜在NaCl溶液中的腐蚀机制,采用极化曲线、电容测量技术,基于半导体电化学方法研究了其在3.5 ％NaCl溶液中耐蚀性能与其半导体特性的关系,得到不同浸泡时间下的载流子浓度以及平带电位.结果表明:镁合金阳极氧化膜为N型半导体,随浸泡时间的增加,载流子浓度呈上升趋势,由浸泡10 min时的1.83×1018 cm-3增大到96 h时8.60×1020cm-3,平带电位为-1.69～-1.52V,低于镁合金(-1.44～-1.57 V),在浸泡时间为1h时膜的平带电位最负,耐蚀性最好；镁合金阳极氧化膜的腐蚀失效过程会经过自我修复期-点蚀诱导期-点蚀期-快速腐蚀期4个阶段.
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