由交叉微米线构成了T形结构,并测量了Pt-Pt和Pt-Au节点的接触热阻和接触电阻。分析表明,增大接触点长度与宽度的比值,线接触模型和椭圆接触模型计算得到的接触热阻的差别逐渐减小,当比值超过20时,椭圆接触模型不再适用。测量得到的接触热阻随温度变化不明显,而接触电阻随温度升高而增大。由于存在表面绝缘层,接触热阻将远大于Wiedemann-Franz定律的预测值。考虑Kundsen数的影响以后,由接触电阻计算得到的金属接触点尺寸近似与温度无关。
A T type probe is established by pressing two microwires crosswise against each other, based on which the thermal and electrical resistances of Pt-Pt and Pt-Au contacts are measured. Theoretical analysis shows that,the difference between the thermal contact resistances derived from a line-contact model and an elliptic-contact model is reduced when the length-to-width ratio of the contact increases,if the ratio is larger than 20,the elliptic-contact model is not applicable.The measured thermal contact resistance is almost constant at different temperatures,while the electrical contact resistance increases with the increase of temperature.Due to the presence of insulating layer, the thermal contact resistance is about an order larger than that predicted by the Wiedemann-Franz law.Taking the Kundsen number into consideration,the contact size calculated by the electrical contact resistance is nearly temperature independent.
参考文献
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