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本文利用透射电子显微镜对进口和国产非晶带材的非晶化程度进行了精确测定.结果表明,XRD实验只能粗略的判定材料是否为非晶态;进口带材在熔淬态下为完全的非晶态,而国产带材并非完全的非晶态,其磁性相α-Fe(Si)的尺寸为100nm左右,数量密度大约为1015 m-3数量级.

参考文献

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