以Sm和Sm2S3为靶材,采用双靶子溅射系统,于单晶Si基板上成功制作了S-SmS和M-SmS微晶薄膜,并采用XRD,AFM和RBS及光学性能测定等测试手段对薄膜进行了分析测试.结果表明:基板温度低于200℃的情况下;或者在基板温度为400℃,薄膜组成中Sm过量的条件下均可以直接获得在常温常压下稳定存在的M-SmS微晶薄膜.S-SmS和M-SmS微晶薄膜表现出明显不同的光学特性.
参考文献
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