本文实验研究了ZuO压敏陶瓷击穿、非线性指数α和脉冲大电流冲击后击穿场强E1mA变化率的几何效应．对ZuO晶粒尺寸的统计分析表明它基本服从正态分布．建立了微观结构模型，计算机模拟得到的击穿几何效应规律与实验规律相同．临界厚度dc与方差σ2和平均晶粒尺寸μ的乘积成正比．
The dimensional effects of breakdown strength, nonlinear coefficient and change in breakdown strength due to current impulse were experimentally studied. The distribution of ZnO grain size was statistically analyzed, which was obtained to be normal distribution. A microstructure model was proposed. The thickness dependence of the breakdown strength E1mA obtained by means of computer sinmlatiou is the same as cxperimental one. The critical thickness dc is proportional to the product of variance σ2 and average length μ of ZnO grains.
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