Single barrier magnetic-tunnel-junctions (MTJs) with the layer structure of Ta(5)/Cu(30)/Ta(5)/Ni79Fe21 (5)/Ir22 Mn78(12)/Co60Fe20B20(4)/Al(0.8)-oxide/Co60Fe20B20(4)/Cu(30)/Ta(5) [thickness unit: nm] using the amorphous Co60Fe20B20 alloy as free and pinned layers were micro-fabricated. The experimental investigations showed that the tunnel magnetoresistance (TMR) ratio and the resistance decrease with increasing dc bias voltage from 0 to 500 mV or with increasing temperature from 4.2 K to RT. A high TMR ratio of 86.2% at 4.2 K, which corresponds to the high spin polarization of Co60Fe20B20, 55%, was observed in the MTJs after annealing at 270℃ for 1 h. High TMR ratio of 53.1%, low junction resistance-area product RS of 3.56 kΩμm2, small coercivity HC of ≤4Oe, and relatively large bias-voltage-at-half-maximum TMR with the value V1/2 of greater than 570 mV at RT have been achieved in such Co-Fe-B MT Js.
参考文献
[1] | J M Daughton .[J].Journal of Applied Physics,1997,81:3758. |
[2] | R. C. Sousa;J. J. Sun;V. Soares .Large tunneling magnetoresistance enhancement by thermal anneal[J].Applied physics letters,1998(19/24):3288-3290. |
[3] | S.Tehrani;J.M.Slaughter;E.Chen;M.Durlam,J.Shi M.DeHerrera .[J].IEEE Transactions on Magnetics,2000,35:2814. |
[4] | K Machida;N Hayashi;Y Miyamoto;T.Tamaki H.Okuda .[J].Journal of Magnetism and Magnetic Materials,2001,235:201. |
[5] | X F Han;M Oogane;H Kubota;Y.Ando T.Miyazaki .[J].Applied Physics Letters,2000,77:283. |
[6] | X F Han;T Miyazaki .[J].Journal of Materials Science and Technology,2000,16:549. |
[7] | H Kano;K Bessho;Y Higo;K.Ohba, M.Hashimoto, T.Mizuguchi M.Hosomi .[R].in Inter Mag 2002,DigAmsterdam,The Netherlands,paper BB04 |
[8] | D.Wang;C.Nordman;J.M.Daughton;Z.Qian J.Fink .[J].IEEE Transactions on Magnetics,2004,40:226. |
[9] | S Yuasa;A Fukushima;T Nagahama;K.Ando Y.Suzuki .[J].Japanese Journal of Applied Physics Part 2,2004,43(02):L588. |
[10] | M Julliere .[J].Physics Letters A,1975,54:225. |
[11] | D. J. Monsma;S. S. P. Parkin .Spin polarization of tunneling current from ferromagnet/Al_(2)O_(3) interfaces using copper-doped aluminum superconducting films[J].Applied physics letters,2000(5):720-722. |
[12] | S.Zhang;P.M.Levy;A.C.Marley;S.S.P. Parkin .[J].Physical Review Letters,1997,79:3744. |
[13] | X F Han;J Murai;Y Ando;H.Kubota T.Miyazaki .[J].Applied Physics Letters,2001,78:2533. |
[14] | X F Han .[J].Journal of Materials Science and Technology,2002,18:497. |
[15] | C.Lü,M.W.Wu;X.F.Han .[J].Physics Letters A,2003,319:205. |
- 下载量()
- 访问量()
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%