利用频域有限差分法,分析了两种典型非晶硅电池结构的Ag背反镜的吸收损耗.研究表明:平板型非晶硅电池Ag背反镜的损耗主要是由银材料的本征吸收和非晶硅有源层导模共振效应引起,而表面等离子体共振吸收使TM模的吸收峰峰值大于TE模的吸收峰峰值;织构型的非晶硅电池内部光场分布复杂,可在光垂直入射情况下,使TE模和TM模均在有源层中出现较强的导模共振效应,且TM模还可在Ag背反镜中激励起等离子体共振效应,从而使织构型非晶硅电池Ag背反镜的吸收谱表现为多峰值特性,且其吸收峰的峰值大于平板型非晶硅电池的吸收峰峰值.
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