采用基于密度泛函理论和广义梯度近似的第一性原理研究了立方相LaAlO3中不同价态氧空位的电子性质.结果表明,氧空位的存在会在立方相LaAlO3的禁带中引入缺陷能级,在氧缺失的条件下,氧空位在立方相LaAlO3中是稳定存在的.随着费米能级位置的改变,具有0价和+2价的氧空位分别为最稳定的电荷状态.LaAlO3中的氧空位具有负U性质,当空位进入到氧化物中时,氧空位会俘获2个空位,达到稳定状态.因此,在LaAlO3高k栅介质中,氧空位为主要俘获电荷的陷阱.
参考文献
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