采用硫酸溶液作为抛光液对轧制辅助双轴织构技术制备的Ni5W合金基带进行电化学抛光,在不同的抛光液浓度下获得了表面状态不同的基带.利用X射线光电子能谱(XPS)、X射线衍射(XRD)、扫描电镜(SEM)等手段研究了抛光过程中表面物质相成分及成因.结果表明:抛光液浓度较低时基带表面会形成过量的氧化物和H2WO4,造成表面选择性溶解过程紊乱,导致无法抛光.通过优化抛光液浓度可在基带表面获得适当厚度的固体层和粘液层,电流通过时可获得良好的抛光效果.
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