计算了外压调制下ZnO体系电子结构特性,分析了外压对ZnO电子结构的影响.所有计算都是基于密度泛函理论(DFT)框架下的第一性原理平面波超软赝势方法.结果表明:随着压力的逐渐增大,Zn-O键长缩短,价带与导带分别向低能和高能方向漂移,带内各峰发生小的劈裂,带隙Eg明显展宽,Zn的3d电子与O的2p电子杂化增强.
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