欢迎登录材料期刊网

材料期刊网

高级检索

铝箔的力学性能通常是采用拉伸法来测量,且测量其弹性模量和残余应力的报道也很少见.本文通过利用鼓膜法结合数字散斑相关法(DSCM)对铝箔变形进行了高精度的全场位移测量,根据测得的薄膜压力与中心挠度关系再结合方形膜鼓膜理论模型,测量了厚度为6μm的铝箔的弹性模量和残余应力.实验测得的铝箔的平均弹性模量为65GPa,由粘接过程中引入的残余应力在12~50MPa之间变化.最后根据实验结果对鼓膜实验进行有限元反分析,结果表明,实验结果与有限元模拟结果基本一致.

参考文献

[1] J.W.Beams.Mechanical properties of thin films of gold and silver[J].Structure and properties of thin films,1959:183-192.
[2] Huang H.;Spaepen F. .TENSILE TESTING OF FREE-STANDING Cu, Ag AND Al THIN FILMS AND Ag/Cu MULTILAYERS[J].Acta materialia,2000(12):3261-3269.
[3] 任凤章,鞠新华,周根树,胡志忠,赵文轸,郑茂盛.鼓泡法薄膜力学性能测试的研究现状[J].稀有金属材料与工程,2001(05):321-325.
[4] J.J.Vlassak;W.D.Nix .New bulge test technique for the determination of Young‘s modulus and Poisson's ratio of thin films[J].Journal of Materials Research,1992,7(12):3242-3249.
[5] G.Machado;D.Favier;G.Chagnon .Membrane curvatures and stress-strain full fields of axisymmetric bulge tests from 3D-DIC measurements[J].Experimental Mechanics,2012,52(07):865-880.
[6] 柳兆涛,缪泓,辜萍,刘罡,伍小平.氧化铝多孔膜变形的时间序列散斑干涉法检测[J].实验力学,2005(01):51-56.
[7] Determining the mechanical properties of optical films in liquid crystal displays (LCDs)[J].Optics and Lasers in Engineering,2010(3):354.
[8] Jay S. Mitchell;Christian A. Zorman;Thomas Kicher;Shuvo Roy;Mehran Mehregany .Examination of Bulge Test for Determining Residual Stress, Young's Modulus, and Poisson's Ratio of 3C-SiC Thin Films[J].Journal of Aerospace Engineering,2003(2):46-54.
[9] 杜招红,曾效舒.转换阵列式碳纳米管薄膜至铝箔上的工艺[J].材料科学与工程学报,2009(01):92-95.
[10] 宋学萍,周桃飞,赵宗彦,孙兆奇.退火温度对溅射Al膜微结构及应力的影响[J].材料科学与工程学报,2003(05):724-726.
[11] S.Timoshenko.Theory of Plates and Shells[M].New York:McGraw-Hill,1959:400-408.
[12] M.K.Small;W.D.Nix .Analysis of the accuracy of the bulge test in determining the mechanical properties of thin films[J].Journal of Materials Research,1992,7(06):1553-1563.
[13] D.Heinen;H.G.Bohn;W.Schilling .On the mechanical strength of free-standing and substrate-bonded A1 thin films[J].Journal of Applied Physics,1995,77(08):3742-3745.
[14] A. A. Volinsky;N. R. Moody;W. W. Gerberich .Interfacial toughness measurements for thin films on substrates[J].Acta materialia,2002(3):441-466.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%