室温下采用磁控溅射的方法在p-Si(111)衬底上沉积Ba膜,然后置入高真空退火炉中在400～850℃退火12 h生成Ba的硅化物薄膜,对退火后的Ba-Si化合物进行了晶体结构、表面形貌、透射光谱及电学性质的测试分析,研究了退火温度对薄膜结晶的影响.实验结果表明,退火温度对生成Ba-Si化合物及薄膜的表面形貌影响很大,随着退火温度从400℃升高到800℃,薄膜的结晶情况逐渐改善,晶粒随着温度的升高逐渐增大;800℃对于生成多晶的BaSi2薄膜是一个比较理想的退火温度;850℃生成了多相共生的硅化物薄膜.
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