蚀坑制备方法的改进,适用于Si钢热轧、再结晶组织或无取向Si钢等细晶试样的研究.文中介绍了普通金相显微镜观测蚀坑的具体操作方法及特点,列举了蚀坑技术在晶粒位向的确定、织构的研究、断口的分析、磁畴结构取向效应的观察、晶体形变组织的研究以及析出物与基体位向关系的确定等方面运用的实例。由于受最深的限制,使用扫描电镜进行蚀坑观测,效果将更为显著。
Certain improvements of the etch-figure method, suitable for such fine-grain-ed specimens as the matrix of primary recrystallization or the non-oriented siliconiron, are described. The determination of the geometrical parameters of the etch-figures by conventional metallographic microscope is also given. The usefulness ofthe etch-figure method is supported by many practical examples, e. g. determining themisorientation between the neighbouring grains, measuring the orientation and thetextures, analysing the fractures, examining the orientation effect of domain struc-tures, ascertaining the deformation extent of deformed grains as well as indicatingthe orientation relationships between the precipitants and its matrix, etc. Scanningelectron microscope is very helpful for detailed observation and exact measure-ments of the etch pits, because of its long depth of view.
参考文献
[1] | Tassy-Betz, Eva and Prohdszka, J., Metallography, 7 (1974) , 91. |
[2] | Illgen, L. et al., Prakt. Metallogr., 6 (1969) , 363. |
[3] | 罗阳,金属学报,13 (1977) ,93. |
[4] | Tammann, G. et al., Z. Metalluk., 18 (1926) , 176. |
[5] | Sixtus, K. J., Physics (New York), 6 (1935) , 105. |
[6] | Antoniole, A. and Ferri, A., Rev. Met. (Paris), 46 (1949) , 627. |
[7] | Morris, C. E., Metal Progr., 56 (1949) , 696. |
[8] | Paxton, W. S. and Nilan, T. G., J. Appl. Phys., 26 (1955) , 984. |
[9] | Stephenson, J. D., Phys. Status Solidi, 39A (1977) , 89. |
[10] | 田冈忠美,日本金属学会志,30(1966) ,820. |
[11] | 北京钢铁研究院硅钢研究组,金属学报,13(1977) ,80. |
[12] | 罗阳,吕其春,金属学报,13(1977) ,194. |
[13] | Barrett, C. S. et al., Trans ASM, 25 (1937) , 702. |
[14] | 罗阳等,待发表. |
[15] | McCurrie, R. A., Martin, P. J. and Ashurst, S. J., J. Mater. Sci., 10 (1975) , 1788. |
[16] | Leslie, W. C. et al., Trans. ASM, 53 (1961) , 715. |
[17] | Littmann, M. F., Trans. AIME, 245 (1969) , 2217.3 |
- 下载量()
- 访问量()
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%