采用评价钝化膜稳定性的光电化学方法-光电流谱技术,研究敏化不锈钢的钝化膜。光电流谱测试结果表明,对敏化的不锈钢电极,在不同的电位范围内,钝化膜显示出n型或p型半导体的特性。这可以用不同电位下不锈钢钝化膜组分中Cr(Ⅲ)水合程度的不同和表面态的存在来解释。本工作表明,光电流谱技术对于研究不锈钢敏化是很有用的工具。
A photo-electrochemical method for evaluating the stability of passive film was established. Passive films formed on sensitized 1Cr18Ni9Ti stainless steel in an acidic solution (0.5mol/L HZSO4+0.01mol/L KSCN)were examined using photo-current speCtra. The erperimeatal results indicated that the passive films showed characteristics for n-type or p-type semiconductor in different potential regions. The differences in the photo-electrochemical behaviour could be attributed to changes in composition of the passive film associated with different hydration degreeS of Cr(Ⅲ) oxides at different potentials and surface states. The photo-electrochemical technique proved to be useful for studying seasitization of stainless steel.
参考文献
[1] | SunseriC,PiazzaS,PaolaADi,QuartoFDi.J.Electrochem.Soc.,1987,134:24102BurleighTD,LatanisionRM.J.Electrochem.Soc.,1987,134:1353SedriksAJohn.Corrosionofstainlesssteel,johnWiley&sonsInc.19794PaolaADi,ShuklaD,SteammingU.Electrochem.Acta.,1991,36:3455KeshoE,RozenfeldIL.Electrokhimiya,1986,4:12006SunseriC,PiazzaS,QuatoFDi.J.Electrochem.Soc.,1990,137:24117VermilyeaDA.AdvancesinElectrochemistryandElectrochemicalEngineering,1963,3(N.Y) |
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