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Perimeter-Area Relation and Fractal Dimension of Fracture Surfaces

Duanwen SHI , Jian JIANG , Enke TIAN and Chiwei LUNG(International Centre for Materials Physics , Institute of Metal Research , Chinese Academy of Sciences , Shenyang 110015 , China)

材料科学技术(英文)

We have theoretically analysed the perimeter-area relation and simulated its application to measuring the fractal dimension of fracture surfaces. It is proved that the fractal dimension Dobtained by slit island method (SIM) is related to the dependence of measured area A(δ) ofthe slit island on yardstick δ. So in some cases, the dimension D obtained by SIM is dependenton yardstick and in other cases independent on yardstick δ. But in all cases, when δ→0 thedimension D obtained by SIM approaches the real fractal dimension (similar dimension) of coastline' of the island. We analysed some experimental data and found some new and interestingcharacteristics of crack propagation in steels.

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CURRENT STATUS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND ITS APPLICATIONS TO MATERIALS SCIENCE AND CONDENSED MATTER PHYSICS

材料科学技术(英文)

The present paper summarizes the current status of high resolution elect;on microscopy ( HREM) and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction, subnanometer level analysis, image simulation and image processing.

关键词: juxtaposed pentagonal antiprisms;two-dimensional quasicrystal;domain;boundary structures;close-packed phases;nanocrystalline materials;crystal-structure;copper oxidation;initial-stage;translational;symmetry;rotational symmetry

Current Status of High Resolution Electron Microscopy and Its Applications to Materials Science and Condensed Matter Physics

Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids , Institute of Metal Research , Chinese Academy of Sciences , Shenyang , 110015 , China)

材料科学技术(英文)

The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.

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