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OXYGEN SELF-DIFFUSION AND INTERACTIONS BETWEEN DEFECTS IN Fe_3O_4

Y. Niu and F. Millot(1) State Key Laboratory for Corrosion and Protection , Institute of Corrosion and Protection of Metals , The Chinese Academy of Sciences , Shenyang 110015 , China2) Centre de Recherche sur la Physique des Hautes Temperatures 1D , Av. de la Recherche Scientifique 45071 Orleans Cedex , France)Manuscript received

金属学报(英文版)

New experimental results on the self diffesion of oxygen in Fe3O4 obtained with a high precision SIMS at 1079K allow to conclude the eristence of oxygen vacancies and of oxygen iron vacancy pairs coexisting selectively with different kinds of iron defects.The possibility of measuring the isotopic effect of the two tracers O17 and O18 is also examined.

关键词: oxygen , null , null , null

WELDING BETWEEN HIGH MANGANESE STEEL AND HIGH CARBON STEEL

M. H. Guo , D. C. Shao , Z. G Dong and J. C Yang National Key Laboratory Advanced Welding Production Technology , Harbin institute of Technology , Harbin 150001 , China

金属学报(英文版)

Manuscript received 30 July 1999 Abstract The shielded metal arc welding (SMAW) of a manganese steel part as a crossing of railway track to a carbon steel part as the rails of the railroad is the welding of dissimilar steel. It are was known that it is not possible to the the rail of railroad directly to the cross- ing of railway track made from a steel containing about 14% of manganese (wt. ) because of so many differences between the two kinds of steels such as composition, microstructure,mechanical properties and weldability.A method was used to solve the problem by presetting an intermediate layer on each side of the joint and other special procedures were used.The result of test indicated that a good weld joint was obtained.

关键词: high manganese steel , null , null , null

PRIMARY STUDY FOR THE TECHNOLOGY OF ELECTROLESS PLATING Fe Al P ALLOYS

L.L.Wang , L.H.Zhao , W.Y.Hu , X.L.Shu , X.J.Yuan , B.W.Zhang and X.Sheng Department of Applied Physics , Hunan University , Changsha 410082 , China

金属学报(英文版)

Manuscript received 24 June 1999 The Fe Al P alloy deposits were plated on copper sheets by electroless plating. The change law of the deposition rate, composition, surface appearance and structure for the deposits was studied by changing the metallic salt ratios (AlCl 3/AlCl 3+FeSO 4), the concentration of metallic salt AlCl 3 and reductant NaH 2PO 2. The optimum plating bath was obtained. It was found that the choices of ligand and reductant were the key of increasing Al content for the deposits.

关键词: electroless Fe Al P plating , null , null , null

EFFECT OF MAGNETIC FIELD ON CALCITONIN GENE-RELATED PEPTIDE IN PERIODONTAL LIG AMENTS OF RATS

X. Chang , K. Qin and Y.L.Lu Orthodontic Department of Stomatology College , China Medical University , Sheny ang 110001 , China

金属学报(英文版)

proach change of CGRP with time in periodontal ligaments of rats in magnetic field, maxillae of 28 Wistar rats of 6 7 weeks were placed in magnetic fields of permanent magnets Nd 2 Fe 4 B. Changes of CGRP with t ime in maxillary periodontal ligaments of the rats were studied by immunohistochemistry. The result showed that: magnetic field had dynamic effect and some promotional effect on recove?E F F E C T O F M A G N E T I C F I E L D O N C A L C I T O N I N G E N E- R E L A T E D P E P T I D E I N P E R I O D O N T A L L I G A M E N T S O F R A T S X. Chang , K. Qin and Y. L. Lu Orthodontic Department of Stomatology College , China Medical University , Shenyang 110001 , China Manuscript received 24 June 1999 In order to approach change of C G R P with tim e in periodontal liga m ents of rats in m agneticfield , m axillae of 28 Wistar rats of 6 7 weeks w ere placed in m agnetic fields of per m anentm agnets Nd 2 Fe4 B. Changes of C G R P with tim e in m axillary periodontal liga ments of therats were stu died by i m m unohistoche mistry . The result sho wed that : m agnetic field had dy na m ic effect an d so m e pro motional effect on recovering and reconstruction of the periodontaltissues in it . This provided a better theoretical evidence for clinical use of per m anent m agnets .

关键词: per m anent m agnet Nd 2 Fe4 B , null , null , null

ATOMIC FORCE MICROSCOPY OBSERVATION OF MAGNETRON SPUTTERED ALUMINUM-SILICON ALLOY FILMS

金属学报(英文版)

粒裕希停桑谩。疲希遥茫拧。停桑茫遥希樱茫希校佟。希拢樱牛遥郑粒裕桑希巍。希啤。停粒牵危牛裕遥希巍。樱校眨裕裕牛遥牛摹。粒蹋眨停桑危眨停樱桑蹋桑茫希巍。粒蹋蹋希佟。疲桑蹋停?##2##3##4##5ATOMICFORCEMICROSCOPYOBSERVATIONOFMAGNETRONSPUTTEREDALUMINUM-SILICONALLOYFILMSJ.W.Wu,J.H.FangandZ.H.Lu(NationalLaboratoryofMoleculeandBiomoleculeElectronics,SoutheastUniversity,Nanjing210096,ChinaManuscriptreceived27October1995)Abstrcat:Twodifferentsurfacemorphologycharacteristicsofmagnetronsputteredaluminumsilicon(Al-Si)alloyfilmsdepositedat0and200℃wereobservedbyatomicforcemicroscopy(AFM).Oneisirregularlyshapedgrainsputtogtheronaplane.TheotherisirregularlyshapedgrainsPiledupinspace.Nanometer-sizedparticleswithheightsfrom1.6to2.9nmwerefirstobserved.Onthebasisoftheseobservationsthegrowthmechanismofmagnetronsputteredfilmsisdiscussed.Keywords:magnetronsputtering,Al-Sialloy,surfacemorphology,atomicforcemicroscopy,filmgrowthmechanism1.IntroductionTheuseofaluminumalloys[1,2],inparticularAl-Si,isacommonfeatureinmanysinglelevelandmultilevelinterconnectionschemesadoptedinthemanufactureofmicroelectronicdevicesbecauseofseveraldesirableproperties.TheAl-Sigrainmorphology(size.geometryanddistributionofgrainsisassociatedwithstepcoverage[3],electromigration[4]andinterconnectsresistivity[5]etc..Thus,characterizationofAl-Sialloysurfacemorphologyisveryimportant,especiallywhenintegratedintensityincreasesandlinewidthsof0.3to0.5μmbecomecommon.Inthepasttwentyyears,theAl-Sialloysurfacemorphologywhichaffectsthereliabilityofmicroelectronicdeviceshasbeenwidelyinvestigatedbyscanningelectronmicroscopy(SEM),transmissionelectronmicroscopy(TEM)etc.[5-7].However,SEMandTEMhavetheirlimitationorinconvenience,forexample,theverticalresolutionofSEMisnothighandTEMneedscomplexsamplepreparation.Recently,anewgrainboundaryetchingmethodwasproposed ̄[8]whichalsoneedstroublesomechemicaletching.Atomicforcemicroscopy(AFM),sinceitsemerging,hasbecomemoreandmoreusefulinphysics,chemistry,materialsscienceandsurfacescience,becauseofitshighresolution,easeofsamplepreparationandrealsurfacetopography.Recently,discussion[9,10]waspresentedonhowAFMwillplayaroleinsemiconductorindustry.Asaresponsetothisdiscussion,weusedAFMtoinvestigateAl-SialloysurfacemorphologyandhaveobtainedsomeresultswhichcannotberevealedbySEMorTEM.ThisindicatesthatAFMisagoodcharacterizationtoolinsemiconductorindustry.2.SamplePreparationInourexperiments,aluminumwith30ppmsiliconwassputteredonsiliconsubstrateinbatchdepositionmodeAllthreefilmswiththicknessof1.6μmweredepositedusinganargonsputteringpressureof4.2×10 ̄-3Pa.TheotherdepositionparametersaredescribedinTable1.Thesubstratewascleanedusingstandardpremetallizationcleaningtechniquespriortofilmdeposition.3.ExperimentalResultsandDiscussionTheAFMmeasurementswereperformedonacommercialsystem(NanoscopeIII,DigitalInstruments,SantaBarbara).Thetipismadeofmicrofabricatedsiliconnitride(Si_3N_4)Itisattachedtoa200μmcantileverwithaforceconstantofabout0.12N/m.Beforethesurfaceofsamplewasexamined.agoodtipwithananometer-sizedprotrusionatitsendwasselectedbeforehand,whichcanbeobtainedbyimagingtheatomicstructureofmicasubstrateandagoldgrid.AtypicaloperatingforcebetweenthetipandAl-Sisamplesurfaceisoftheorderof10 ̄-8Nandallimagesweretakenatroomtemperatureinair.AtypicaltopographicviewoftheAl-SifilmsisshowninFig.1(allimagescansizeis5by5μma,bandcarerespectivelyforsample1,2,and3).FromFig.la,itcanbeseenthatirregularlyshapedgrainstiltinginvaryingdegreespileupinspace,andgroovesamongtheirregularlyshapedgrainsaredifficulttodecideatacertainarea(wedefineitascharacteristicA).Toourknowledge,onreportsonthesurfacemorphologyhavebeenpresentedbefore.InFig1b,however,irregularlyshapedgrainsassembleonaPlaneandgroovesamongtheirregularlyshapedgrainsareeasytodecide(wedefineitascharacteristicB),whichisinagreementwithmanypreviousreports[5-7].InFig.1c,bothcharacteristicA(arrowA)andcharacteristicB(arrowB)wereobserved.IndoingAFMexperiments,weselectedfivedifferentscanareastobeimagedforeachsampleandfoundthatallimagesofeachsamplearerespectivelysimilartoFig.1a,bandc.Also,wenotedthatthesurfaceofinFig.1a.WethinkthatdepositionparameterswillinfluenceAl-Sisurfacemorphology,andthetiltedgrainsmaybesusceptibletomicrocracking.Byreducingthescansizeareato2by2μm(Fig.2aandb).Weobtainedmanyidenticalresultsasdescribedabove,suchasirregularlyshapedgrainsetc.Forthefirsttime,wefoundnanometersizedparticlesonirregularlyshapedgrainsurfacewhichcannotberevealedbySEMbecausethediameterofthesenanoparticlesisabout10nmandtheheightofthesenanoparticlesisintherangeof1.6to2.9nm.Inimaging,wenotedthatrotatingthescandirectionandchangingthescanfrequencydidnotaffectthestructureofthesegrainsasshowninFig.2aandb,rulingoutthepossibilitythatscanninginfluencedtheshapeoftheseparticlesorcausedsomesimilarimagingartifacts.Also,wenotedthatthenanoparticleswerenotobservedontheslopesofthegrooves(Fig.2aandb).Thisphenomenoncanbeexplainedasfollows:thepotentialenergyattheslopeislargerthanthatelsewhere,sotheparticlesseemmorelikelytobedepositedontheseareaswithlowerpotentialenergy.Fig.2c,scansize250by250nm,isazoomtopographicimage(whiteoutlineinb).Itshowsunevendistributionofthenanoparticles.Andtheheightdifferenceofthenanoparticlesindicatesdifferentgrowingspeed.Wethinkbasedonthemorphologyofnanoparticles,thattheheightdifferenceandunevendistributionofthesenanoparticlesshowdifferentgrowingadvantageandindicatethatatomshaveenoughenergytomovetoasuitablegrowingspot.Theenergymaybefromthefollowingsources:surfacetemperaturefluctuation,stressdifferenceorcollisionbetweenhighspeedsputteredatoms.Thesenanoparticlesgoongrowingandformmanyirregularlyshapedgrains.AndtheseirregularlyshapedgrainsfurtherconnecteachotheraccordingtocharacteristicAorB,finallyformingtheAl-Sisurfacemorphology.4.ConclusionWecandrawthefollowingconclusionsfromtheabove.First,theexperimentalresultsshowedthatAFMisapowerfultooltoinvestigatethedetailsofAl-Sisurfacemorphologywhichcangreatlyenrichourknowledgeofthefilmgrowthmechanism.Second,depositionconditionsplayanimportantroleindeterminingtheAl-Sisurfacemorphology.Third,thetwoAl-Sisurfacemorphologycharacteristicsarethatirregularlyshapedgrainsassembleonaplaneandirregularlyshapedgrainstiltinginvaryingdegreespileupinspace.Fourth,forthefirsttime,nanoparticleswereobservedonirregularlyshapedgrainsurfacewhichsuggestedthatthefilmgrowthmechanismwasbyinhomogeneousnucleation.Acknowledgements-BeneficialdiscussionswereheldwithDr.ZhenandMr.Zhu.ThisworkwaspartiallysupportedbytheNationalNaturalScienceFoundationofChina.RFFERENCES||1D.pramanikandA.N.Saxena,SolidStateTechnol.26(1983)127.2D.pramanikandA.N.Saxena,SolidStateTechnol.26(1983)131.3D.pramanikandA.N.Saxena,SolidStateTechnol.33(1990)73.4S.S.IyerandC.Y.Worg,J.Appl.phys.57(1985)4594.5J.F.Smith,SolidStateTechnol.27(1984)135.6D.GerthandD.Katzer,ThinSolidFilm208(1992)67.7R.J.WilsonandB.L.Weiss,ThinSolidFilm207(1991)291.8E.G.Solley,J.H.Linn,R.W.BelcherandM.G.Shlepr,SolidStateTechnol33(1990)409I.SmithandRHowland,SolidStateTechnol.33(1990)53.10L.Peters,SemiconductorInternational16(1993)62.##61D.pramanikandA.N.Saxena,SolidStateTechnol.26(1983)127.2D.pramanikandA.N.Saxena,SolidStateTechnol.26(1983)131.3D.pramanikandA.N.Saxena,SolidStateTechnol.33(1990)73.4S.S.IyerandC.Y.Worg,J.Appl.phys.57(1985)4594.5J.F.Smith,SolidStateTechnol.27(1984)135.6D.GerthandD.Katzer,ThinSolidFilm208(1992)67.7R.J.WilsonandB.L.Weiss,ThinSolidFilm207(1991)291.8E.G.Solley,J.H.Linn,R.W.BelcherandM.G.Shlepr,SolidStateTechnol33(1990)409I.SmithandRHowland,SolidStateTechnol.33(1990)53.10L.Peters,SemiconductorInternational16(1993)62.##A##BATOMIC FORCE MICROSCOPY OBSERVATION OF MAGNETRON SPUTTERED ALUMINUM-SILICON ALLOY FILMS$$$$J.W.Wu,J.H. Fang and Z.H.Lu (National Laboratory of Molecule and Biomolecule Electronics,Southeast University,Nanjing 210096, China Manuscript received 27 October 1995)Abstrcat:Two different surface morphology characteristics of magnetron sputtered aluminumsilicon(Al-Si)alloy films deposited at 0 and 200℃ were observed by atomic force microscopy(AFM).One is irregularly shaped grains put togther on a plane.The other is irregularly shaped grains Piled up in space. Nanometer-sized particles with heights from 1.6 to 2.9 nm were first observed. On the basis of these observations the growth mechanism of magnetron sputtered films is discussed.

关键词: :magnetron sputtering , null , null , null , null

Controversy about the Origin of the Grain Boundary Internal Friction Peak and Its Clarification

T.S.Ke (Tingsui GE)(Lab. of Internal Friction and Defects in Solids , Institute of Solid State Physics , Chinese Academy of Sciences , Hefei 230031 , China)

材料科学技术(英文)

In the seventies some scientific workers from France and ltaly suggested that the grain boundary internal friction peak (named the Ke peak in the literature) widely accepted as a grain bound ary process, is originated from the motion of lattice dislocations. Since this problem is one of fundamental importance, this controversy has drawn much international attention. Started from 1982, the Hefei research group made a critical analysis of the large amount of literature concerning this problem and performed a series of crucial experiments to clarify the controversy It is concluded that the irrelevant evidence suggested by the controverters comes from the farfetched interpretation and the mis-identification of the internal friction peaks appeared under various experimental conditions and different states of the specimens.

关键词:

MICROSTRUCTURE CHANGE IN SIC WHISKERS AFTER HIGH-TEMPERATURE ANNEALING

Philosophical Magazine Letters

The microstructure of as-received and post-annealed SiC whiskers were investigated by transmission electron microscopy. In the as-received SiC whiskers, the thinner beta-SiC parts were jointed with the one-dimensional disordered parts by {111}, twin boundaries. After annealing, beta-SiC parts became coarser than the one-dimensional disordered parts at 1900-degrees-C and then disappeared at 2000-degrees-C.

关键词: matrix composites

EFFECT OF PROCESSING TEMPERATURE ON THE MORPHOLOGY OF SILICON-CARBIDE WHISKERS

Journal of the American Ceramic Society

Two kinds of SiC whiskers were annealed at temperatures similar to those for the processing of ceramic matrix composites. The morphology and structure of the as-received and postannealed whiskers were investigated by SEM, TEM, and XRD, and the influence of processing temperature on the mechanical properties of ceramic matrix composites was discussed.

关键词: silicon carbide;whiskers;microstructure;mechanical properties;composites;matrix composites

Temperature influence of ceramic form on the structure of cobalt alloy MAR-M509 castings

ZENON OPIEKUN

金属学报(英文版)

The manuscript presents changes of macrostructure and microstructure of plate and shaft castings made of cobalt alloy MAR-M509. They have different values of geometric module M within the range of 0.91-5.56 mm that have been created with multilayer ceramic shell moulds (MSC) of different initial temperatures of 200-1000℃ at the moment of pouring. It has been stated that decrease of initial temperature of MSC and value M causes increase in casting fine-granularity, distance reduction between dendrite branches λ2 and refinement of initial carbides in irregular ternary eutectic γ+$M23C6+MC.

关键词: Multilayer ceramic shell mould (MSC)

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