Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids
,
Institute of Metal Research
,
Chinese Academy of Sciences
,
Shenyang
,
110015
,
China)
材料科学技术（英文）
The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.
关键词:
Zhenfu DONG and Lianmao PENG(Beijing Lab. of Electron Microscopy
,
Institute of Physics and Center for Condensed Matter Physics
,
Chinese Academy of Sciences
,
P.O.Box 2724
,
Beijing 100080
,
China)Ke LU and Zhuangqi HU(State Key Lab. for RSA
,
Institute of Meta
材料科学技术（英文）
A nanostructured Hf11Ni89 ribbon sample was prepared by melt-spinning. It was found that the as-quenched sample is composed of a major HfNi5 compound nanophase and an interfacial magnetic Ni(Hf) solid solution phase. The structure evolution of the sample was studied by using X-ray difFraction (XRD), transmission electron microscopy (TEM), difFerential scanning calorimetry (DSC), resistivity and magnetothermal analysis. Upon heating, a second precipitation process of the Ni(Hf) phase prior to grain growth wa5 detected by means of both structural analysis and physical property measurements. The measurement results are discussed based on the relationship between microstructure and physical properties.
关键词:
