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Thin-Wall Aluminum Die-Casting Technology for Development of Notebook Computer Housing

Chang-Seog Kang , Jae-Ik Cho , Chang-Yeol Jeong , Se-Weon Choi , Young-Chan Kim

材料科学技术(英文)

Silicon-based aluminum casting alloys are known to be one of the most widely used alloy systems mainly due to their superior casting characteristics and unique combination of mechanical and physical properties. However, manufacturing of thin-walled aluminum die-casting components, less than 1.0 mm in thickness, is generally known to be very difficult task to achieve aluminum casting alloys with high fluidity. Therefore, in this study, the optimal die-casting conditions for producing 297 mm×210 mm×0.7 mm thin-walled aluminum component was examined experimentally by using 2 different gating systems, tangential and split type, and vent design. Furthermore, computational solidification simulation was also conducted. The results showed that split type gating system was preferable gating design than tangential type gating system at the point of view of soundness of casting and distortion generated after solidification. It was also found that proper vent design was one of the most important factors for producing thin-wall casting components because it was important for the fulfillment of the thin-wall cavity and the minimization of the casting distortion.

关键词: Aluminum , null , null , null

基于改进Chan-Vese模型的图像分割

杨名宇

液晶与显示 doi:10.3788/YJYXS20142903.0473

目前基于水平集的图像分割方法很难给出基于全局极值的算法终止条件,而大多采用事先设定迭代次数的方法.本文提出了一种改进的Chan-Vese模型,通过添加水平集函数约束项,使得新模型抑制了水平集函数的取值范围,最终收敛至全局极值,并以此作为算法终止条件,无需事先设定迭代次数.实验结果表明,新模型在其终止条件下,分割结果正确,与传统Chan-Vese模型相比,新模型的收敛速度快3~6倍,且通用性更强.

关键词: 图像分割 , Chan-Vese模型 , 水平集方法

Thermodynamic discussion on Young's equation in wetting

Zeitschrift Fur Metallkunde

Young's equation is discussed on a thermodynamic basis. The result shows that the equation is a thermodynamic equilibrium of the wetting system rather than a force balance. The equilibrium satisfies the general equilibrium condition, that is, Gibbs free energy should be minimum when the wetting equilibrium is reached. The validity of Young's equation is only limited to some special cases, namely if the droplet shape is an exact sphere sector. It implies that Young's equation can only be used in the case without the action of gravity. If the curve of the liquid surface changes, the term of cos theta in Young's equation should be replaced by another functional form of the contact angle theta. In the discussion, the author suggests that, in the case of a solid, the surface energy should be considered rather than the surface tension, and the concept of a solid surface tension should be reconsidered based on the difference between a liquid surface and a solid surface.

关键词:

Evaluation of Young's Modulus and Residual Stress of NiFe Film by Microbridge Testing

Zhimin ZHOU , Yong ZHOU , Mingjun WANG , Chunsheng YANG , Ji'an CHEN , Wen DING , Xiaoyu GAO , Taihua ZHANG

材料科学技术(英文)

Microbridge testing was used to measure the Young's modulus and residual stress of metallic films. Samples of freestanding NiFe film microbridge were fabricated by microelectromechanical systems. Special ceramic shaft structure was designed to solve the problem of getting the load-deflection curve of NiFe film microbridge by the Nanoindenter XP system with normal Berkovich probe. Theoretical analysis of load-deflection curves of the microbridges was proposed to evaluate the Young's modulus and residual stress of the films simultaneously. The calculated results based on experimental measurements show that the average Young's modulus and residual stress for the electroplated NiFe films are 203.2 GPa and 333.0 MPa, respectively, while the Young's modulus measured by the Nano-hardness method is 209.6±11.8 GPa for the thick NiFe film with silicon substrate.

关键词: Mechanical properties , 金属薄膜 , 纳米压痕

基于Chan-Vese模型的TFT-LCD Mura缺陷快速分割算法

卢小鹏 , 李辉 , 刘云杰 , 梁平 , 李坤

液晶与显示 doi:10.3788/YJYXS20142901.0146

针对传统的Chan-Vese模型(C-V模型)分割背景不均匀的TFT-LCD Mura缺陷速度慢的问题,将水平集函数与符号距离函数的偏差作为能量项引入C-V模型,去掉了符号距离函数重初始化步骤;为了平衡图像的整体亮度不均匀,在传统的C-V模型中引入轮廓曲线内、外部区域之间的亮度差项,提高了分割准确性.在数值实现上,采用无条件稳定的半隐差分格式,适当加大步长,加速曲线演化过程,相比于有限差分格式和AOS格式,分割速度明显提高.实验结果表明,本文提出的算法能够准确地分割背景不均匀的Mura缺陷图像,并且分割速度快.

关键词: Chan-Vese模型 , TFT-LCD Mura缺陷 , 水平集 , 半隐差分格式

基于改进Chan-Vese模型的液晶显示屏Mura缺陷分割

陈凌海 , 姚剑敏 , 郭太良

液晶与显示 doi:10.3788/YJYXS20163106.0613

液晶显示屏 Mura缺陷是一类较难检测的显示缺陷,它具有对比度低、背景亮度不均匀、边缘模糊等特点。针对传统Chan-Vese模型(C-V模型)对其分割时存在误分割及速度慢的问题,本文提出一种改进的C-V模型。首先,依据曲线演化理论,简化了传统C-V模型的图像数据力驱动项,这样减少了迭代过程中的计算量,提高了分割的速度。其次,为了平衡图像的亮度不均匀,在模型中引入一个新的能量项,该能量项与轮廓曲线内、外部之间的亮度差有关,提高了分割的准确性。最后,在算法的实现过程中引入迭代停止的判别式,通过设定分割的精度可以实现迭代的自动停止,并有利于正确地分割出目标。实验结果表明,本文提出的改进C-V模型能够准确分割背景不均匀的 Mura缺陷,并且具有较快的速度。

关键词: Chan-Vese模型 , 液晶显示屏 Mura缺陷 , 亮度不均匀

Determination of reduced Young's modulus of thin films using indentation test

Wuzhu YAN

金属学报(英文版) doi:10.1016/S1006-7191(08)60125-8

The flat cylindrical indentation tests with different sizes of punch radius were investigated using finite element method (FEM) aimed to reveal the effect of punch size on the indentation behavior of the film/substrate system. Based on the FEM results analysis, two methods was proposed to separate film's reduced Young's modulus from a film/substrate system. The first method was based on a new weight function that quantifies film's and substrate's contributions to the overall mechanical properties of the film/substrate system in the flat cylindrical indentation test. The second method, a numerical approach, including fitting and extrapolation procedures was put forward. Both of the results from the two methods showed a reasonable agreement with the one input FE model. At last, the effect of maximum indentation depth and the surface micro-roughness of the thin film on the reduced Young's modulus of the film/substrate system were discussed. The methods proposed in the present study provide some new conceptions on evaluating other properties of thin films, e.g. creep, for which a flat-ended punch is also employed.

关键词: Indentation test , 表观杨氏模量 , 压痕测试;压头尺寸效应;权重方程

Microbridge Testing of Young's Modulus and Residual Stress of Nickel Film Electroplated on Silicon Wafer

Y. Zhou , C.S. Yang , J.A. Chen , G.F. Ding , L. Wang , M.J. Wang , Y.M. Zhang , T.H. Zhang

金属学报(英文版)

Microbridge testing is used to measure the Young's modulus and residual stresses of metallic films. Nickel film microbridges with widths of several hundred microns are fabricated by Microelectromechanical Systems. In order to measure the mechanical properties of nickel film microbridges, special shaft structure is designed to solve the problem of getting the load-deflection curves of metal film microbridge by Nanoindenter XP system with normal Berkovich probe. Theoretical analysis of the microbridge load-deflection curve is proposed to evaluate the Young's modulus and residual stress of the films simultaneously. The calculated results based on the experimental measurements show that the average Young's modulus and residual stress are around 190GPa and 175MPa respectively, while the Young's modulus measured by Nano- hardness method on nickel film with silicon substrate is 186.8±7.34GPa.

关键词: nickel film microbridge , null , null , null

多晶Cu中Young's模量和硬度与晶体取向的关系

郭振丹 , 王秀芳 , 杨晓萍 , 蒋冬梅 , 马学鸣 , 宋洪伟

金属学报 doi:10.3321/j.issn:0412-1961.2008.08.002

采用纳米压入(nanoindentation)和电子背散射衍射(EBSD)技术对多晶Cu样品多个晶粒进行了微观力学性能表征和晶体取向分析.结果表明,Young's模量随晶粒表面法向方向(hkl)与(111)和(001)最小夹角的变化有明显的规律:(hkl)越接近(111),其Young's模量越大;(hkl)越接近(001),其Young's模量越小;而Young's模量随(hkl)与(110)最小夹角的变化无明显规律.硬度随(hkl)与(111),(110)和(001)最小夹角的变化均无明显规律.通过理论计算讨论了上述规律性.

关键词: 多晶铜 , 晶体取向 , 纳米压入 , 电子背散射衍射 , Young's模量 , 硬度

Effect of Zr and Sn on Young's modulus and superelasticity of Ti-Nb-based alloys

Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing

Quaternary Ti-(20-26)Nb-(2-8)Zr-(3.5-11.5)Sn (.wt%) alloys were investigated to evaluate the effects of Zr and Sri on Young's modulus and superelasticity of Ti-Nb-based alloys. X-ray diffraction analysis showed that solution-treated alloys have beta + alpha", beta + omega, alpha" + omega, alpha", or beta microstructures. Zr and Sn increase the lattice parameters of the beta phase; for orthorhombic alpha" matensite, they increase the lattice parameter a but decrease both b and c. The martensitic start temperature of the alpha" is depressed by Zr and Sri additions, whereas the formation of athermal w is dependent on Zr and Sn contents. Differential scanning calorimetry (DSC) measurements show that 1 wt% of Nb, Zr or Sn addition decreases the martensitic start temperature by 17.6, 41.2 or 40.9 K, respectively, due to their negative effect on lattice parameter ratios of the martensite (c/a and b/a). Tensile tests were used to evaluate Young's modulus and superelasticity of the solution-treated alloys. Of the studied alloys Ti-24Nb-4Zr-7.5Sn with single P microstructure has the lowest Young's modulus of 52 GPa and recoverable elastic strain of about 2% at room temperature after cyclic strain. (c) 2006 Elsevier B.V. All rights reserved.

关键词: Young's modulus;superelasticity;biomedical titanium alloy;martensitic;transformation;alloying effect;shape-memory behavior;mechanical-properties;biomedical applications;plastic-deformation;induced martensite;titanium-alloy;mo alloys;ti-29nb-13ta-4.6zr;ta;ti-10v-2fe-3al

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