SUN Enxi Dalian Railway College
,
Dalian
,
ChinaYANG Dazhi Dalian University of Technology
,
Dalian
,
ChinaXU Zuyao (T.Y.Hsu) Shanghai Jiaotong University
,
Shanghai
,
ChinaYANG Fuming ZHAO Ruwen Institute of Physics
,
Academia Sinica
,
Beijing
,
China YANG Dazhi
,
Professor
,
Dalian University of Technology
,
Dalian 116024
,
China
金属学报(英文版)
The pulsed magnetic field induced martensitic transformation with isothermal and athermal kinetics in Fe-2Ni-4Mn(wt-%)alloy has been studied by means of magnetization measurements,optical microscopy and thermodymical analyses.It is shown that there exits a critical magnetic intensity for induing martensitic transformation at a given temperature above Ms.The critical magnetic field increases linearly with increasing ΔT= T-M_S.The magnetic field strongly promotes the athermal martensitic transforamtion and restrains the isothermal one.The entropy change ΔS for athermal transformation at Ms is 4.13 J/mol· K.The effect of magnetic field on martensitic transformation in Fe-21Ni-4Mn alloy is main- ly due to Zeeman effect.Lath,plate and butterfly martensities were observed under magnetic field.
关键词:
magnetic field-induced martensitic transformation
,
null
,
null
Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids
,
Institute of Metal Research
,
Chinese Academy of Sciences
,
Shenyang
,
110015
,
China)
材料科学技术(英文)
The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.
关键词: