Xisheng YE
,
Jian SHA and Zhengkuan JIAO(Dept. of Physics
,
Zhejiang University
,
Hangzhou 310027. China)Zifei PENG and Lide ZHANG(Institute of Solid State Physics
,
Chinese Academy of Sciences
,
Hefei 230031
,
China)
材料科学技术（英文）
Using DTA (difFerential thermal analysis) measurement on nanostructured TiO2, we find two endothermic peaks on the DTA curve. From XRD (X-ray diffraction) analysis of the original nanostructured TiO2 and its heat-treated samples, we obtain the following results: the first endothermic peak corresponds to the desorption of physical or chemical absorption, the second one is related to the structural phase transition from brookite to anatase then to rutile, and this structural phase transition is beneficial to the grain growth of nanocrystal
关键词:
杨金瑞
,
余尚先
,
顾江楠
高分子材料科学与工程
通过对resol(羟甲基酚化合物和低分子量羟甲基酚树脂)DEPT135图谱的分析讨论,得到一系列计算resol微细结构参数的经验公式.根据DEPT135图谱可判断是否发生缩聚反应,根据经验公式可计算酚单体各个活性点参与反应百分率或酚羟基导入率、不同类型缩聚所占百分率及低分子量羟甲基酚树脂的平均核体数.
关键词:
羟甲基酚化合物
,
羟甲基酚树脂
,
DEPT135
,
结构参数
史小慧
,
王蕊欣
,
高保娇
,
雷彩萍
,
李艳华
高分子材料科学与工程
首先采用氯甲基化试剂1,4-二氯甲氧基丁烷对水杨羟肟酸(SHA)实施氯甲基化反应,制得氯甲基化水杨羟肟酸(CMSHA);然后以聚甲基丙烯酸羟乙酯(PHEMA)改性的硅胶微粒PHEMA/SiO2为载体,使其表面的醇羟基与CMSHA上的氯甲基基团发生亲向取代反应,制得水杨羟肟酸功能化的复合螯合吸附材料(SHA-PHEMA/SiO2).考察了取代反应的主要影响因素;并研究了SHA-PHEMA/SiO2对重金属离子的螯合性能.结果表明,CMSHA与PHEMA/SiO2之间的取代反应遵循单分子取代反应(SNl)的机理;较高温度下,强极性溶剂有利于反应的进行.SHA-PHEMA/SiO2对不同重金属离子表现出不同的螯合吸附能力,摩尔吸附容量的顺序为Cu2+＞ Zn2+ ＞Cd2+＞ Pb2+;SHA-PHEMA/SiO2对Cu2+离子的吸附动力学符合伪二级速率方程;其吸附行为同时遵循Freundlich和Langmuir模式.
关键词:
水杨羟肟酸
,
聚甲基丙烯酸羟乙酯
,
硅胶
,
亲核取代反应
,
螯合吸附
Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids
,
Institute of Metal Research
,
Chinese Academy of Sciences
,
Shenyang
,
110015
,
China)
材料科学技术（英文）
The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.
关键词:
