黄文旵
,
周萘
,
Day Delbert E
,
Ray Chandra S
无机材料学报
doi:10.3321/j.issn:1000-324X.2005.04.013
在含高放核废料的玻璃固化体中添加了不同含量的Cr2O3,以考察其对玻璃固化体的结构和性质的影响.对添加Cr2O3的玻璃固化体进行了各种方法(溶出速率法,蒸汽水化侵蚀和试样坚固性法)的化学稳定性的测试.测试结果表明,Cr2O3的引入不会对玻璃固化体的化学稳定性产生不良的影响.与此相反,Cr2O3能抑制各种离子自玻璃固化体中沥析出来,改善玻璃固化体的化学耐蚀性.XRD内标法测定,Cr2O3在铁磷酸盐玻璃中的溶解度可达4.1%,是其在硼硅酸盐玻璃的3倍.FTIR和DTA的结果表明,不同含量的Cr2O3的引入,不会对玻璃固化体的网络结构造成显著的变化.Mossbauer谱表明,Fe2+/Fe3+的比值随着Cr2O3的含量的增加而增大,说明Cr离子和Fe离子在玻璃熔制过程中发生氧化还原反应,形成的Cr+6有利于提高玻璃固化体的化学耐蚀性.
关键词:
铁磷玻璃
,
氧化铬
,
核废料处理
,
化学稳定性
Xiuying GAI Jiabao LI Zengqiao KANG State Key Lab.for Fatigue and Fracture of Materials
,
Institute of Metal Research
,
Academia Sinica
,
Shenyang
,
110015
,
ChinaJiawen HE Xi'an Jiaotong University
,
Xi'an
,
710049
,
China
材料科学技术（英文）
Surface yielding of metallic material was measured with strain gage and X-ray diffraction methods. The results show that.when the residual stress in the transverse direction is involved,the surface yield strength should be evaluated with biaxial Mises criterion.For a medium carbon high strength steel, the yield strength of the bulk material is 581 MPa and the surface yield strengths for 0.05% and 0.1%plastic strain are about 436 MPa and 463 MPa respectively.The 0.05% yield strength will approximately increase to 788 MPa after shot peening.In the early stage of plastic deformation, strain hardening in the surface layer is quite different from that of the bulk sample.
关键词:
biaxial stress
,
null
,
null
,
null
G.A.Liu
金属学报(英文版)
Diamond-like carbon (DLC) films have been deposited on glass substrates using radio-frequency (rf) plasma deposition method, γ-ray, ultraviolet (UV) ray were used toirradiate the DLC films. Raman spectroscopy and infrared (IR) spectroscopy were usedto characterize the changing characteristics of SP3 C-H bond and hydrogen content inthe films due to the irradiations. The results show that, the damage degrees induced bythe UV ray on the SP3 C-H bonds are much stronger than that by the γ-ray. When theirradiation dose of γ-ray reaches 10× 104Gy, the SP3 C-H bond reduces about 50% innumber. The square electrical resistance of the films is reduced due to the irradiationof UV ray and this is caused by severe oxidation of the films. By using the results onoptical gap of the films and the fully constrained network theory, the hydrogen contentin the as-deposited films is estimated to be 10-25at.%.
关键词:
diamond-like carbon film
,
null
,
null
Journal of Testing and Evaluation
To determine residual stresses in a (flat) plate or bar with a rectangular cross-section by X-ray diffraction after removal of material, we can sectionally approximate the measured stress curve with depth using power series, then consequently evaluate the additional stresses created by removal, and finally obtain the true stress distribution with depth before the layers were removed. Formulas to evaluate corrections for stress have been derived. Two examples demonstrate that power series with few terms can provide us with an approximation good enough for the measured stress curve, and that the influence of the approximation on the corrective result is far less than that of the errors arising from the X-ray stress determination itself.
关键词:
x-ray stress determination;stress correction;approximation;power;series;single-side removal;double-side removal;shot peening
Rui XIONG
,
Jing SHI
材料科学技术（英文）
TixAl1-xN films have been prepared by RF reactive magnetron sputtering. X-ray diffraction results showed that TixAl1-xN thin films in this study were hexagonal wurtzite structure with the Ti content up to 0.18. X-ray photoelectron spectrocopy studies provided that the N1s core-electron spectrum of TixAl1-xN thin film brodend with increasing Ti content, and the difference of the chemical shifts for Ti2p3/2 line between TiN and TixAl1-xN thin film was 0.7 eV.
关键词:
TixAl1-xN films
,
null
,
null
Nanostructured Materials
The precise X-ray diffraction structural study of a nanocrystalline Cu sample processed by severe plastic deformation was carried out. The obtained results were compared with the data fi om an initial reference Cu sample. By analysis of the centroid position, broadening, shape of Bragg reflections and background integrated intensities from these two samples, such structural features as a lattice parameter, crystallite size, r.m.s. microstrain, dislocation density Debye-Waller parameter and atomic displacements were determined. A conclusion concerning the specific defect structure in the nanocrystallite Cu sample was drawn. (C) 1997 Acta Metallurgica Inc.
关键词:
crystalline
J.Bashir
,
R.T.A.Khan
,
T.Ikeda
,
Kenichi Ohshima
材料科学技术（英文）
Thermal parameters of TlBr were determined using both X-ray and neutron diffraction techniques. The data was analysed by Rietveld profile refinement procedure. From the neutron diffraction data, due to weak odd-order reflections, it was not possible to determine the individual thermal parameters. The X-ray diffraction measurements yielded B Tl=0.296(5) nm2 and BBr=0.162(5) nm2. The overall isotropic value, B was 0.252(7) nm2 which is in good agreement with B=0.230(8) nm2 obtained from present neutron diffraction measurements. The present values are also in good agreement with theoretical estimates obtained from the shell models.
关键词:
Thallium bromide
,
null
,
null
,
null
