SHEN Baogen ZHANG Zhiying GUO Huiqun ZHAO Jiangao Institute of Physics
,
Academia Sinica
,
Beijing
,
ChinaGU Benxi Nanjing University
,
Nanjing
,
China
金属学报(英文版)
The magnetization curves at 1.5 K and thermomagnetic curves for amorphous Fe_(90-x)Si_xZr_(10)(x=0,4,7 and 10)alloys prepared by the drum spinning technique have been measured with an extracting sample magnetometer.It is obtained that the average magnetic moment,,per magnetic atom and Curie temperature,T_c,in the amorphous FeSiZr alloys increase with increasing Si content.The and T_c are found to be quite small,compared with amorphous FeSiB alloys.This unusual behavior is suggested to be due to the presence of the Fe—Fe antiferromagnetic interactions.The temperature dependence of magnetization at lower temperature is in accordance with Bloch's T~(3/2) law.Calculation shows that the spin wave stiffness constant,D,increases with increasing Si content from 0.37 meV·nm~2 for x=0 to 0.538 meV·nm~2 for x=10.The values ofindicate that the range of the exchange interaction is roughly the mean atomic distance of nearest neighbours.
关键词:
amorphous FeSiZr alloys
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null
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null
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中国腐蚀与防护学报
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关键词:
Douxing LI and Hengqiang YE (Laboratory of Atomic imaging of Solids
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Institute of Metal Research
,
Chinese Academy of Sciences
,
Shenyang
,
110015
,
China)
材料科学技术（英文）
The present paper summarizes the current status of high resolution electron microscopy (HREM)and the applications of HREM to materials science and condensed matter physics. This review recounts the latest development of high resolution electron microscope, progress of HREM and the applications of HREM, including the crystal structure determination of microcrystalline materials and characterization of the local structure of the defects and nanostructured materials as well as qualitative and quantitative analysis of the grain boundaries, interfaces and interfacial reactions in the advanced materials by means of HREM in combination with electron diffraction,subnanometer level analysis, image simulation and image processing.
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