{"currentpage":1,"firstResult":0,"maxresult":10,"pagecode":5,"pageindex":{"endPagecode":5,"startPagecode":1},"records":[{"abstractinfo":"Mott-Schottky plots and photoelectrochemical measurement were carried out on <span style=\"color:red\">film</span> formed on stainless steel by alternating voltage (av) and direct current (dc) passivation in a Na2SO4 solution. The frequency dispersion of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> was investigated. Flat band potential and donor densities were determined from Mott-Schottky plots. The results showed that the av <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> behaved like a semiconductor, and the difference in semiconducting properties between av and dc <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> was discussed.","authors":[],"categoryName":"|","doi":"","fpage":"255","id":"250b678f-f7d1-435d-8322-8f38e615dafe","issue":"5","journal":{"abbrevTitle":"TOTIOMF","id":"86ccda36-fa40-499d-9e20-1381134e309e","issnPpub":"0020-2967","publisherId":"TOTIOMF","title":"Transactions of the Institute of Metal Finishing"},"keywords":[{"id":"03856dfa-e71e-4689-b29a-3dec77a2daf9","keyword":"alternating voltage <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>;semiconducting properties;Mott-Schottky plots;photoelectrochemical measurement","originalKeyword":"alternating voltage passive film;semiconducting properties;Mott-Schottky plots;photoelectrochemical measurement"}],"language":"en","publisherId":"0020-2967_2005_5_1","title":"Capacity of alternating voltage <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> on stainless steel","volume":"83","year":"2005"},{"abstractinfo":"The effect of hydrostatic pressure on the nature of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> of nickel in 3.5% NaCl solution was investigated by means of polarization curves, electrochemical impedance spectroscopy (EIS), and Mott-Schottky measurement. The experimental results revealed that hydrostatic pressure had two opposite effects on <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> of nickel. On one hand, hydrostatic pressure improved the corrosion resistance of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> of nickel such as the decreased acceptor density. On the other hand, the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> became unstable and showed a higher diffusivity of acceptor density with the increasing of hydrostatic pressure, which deteriorated the corrosion resistance of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> of nickel. The deterioration effect had greater influence on the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> than the improvement effect, which led to the decreasing corrosion resistance of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> with the increasing of hydrostatic pressure.","authors":[],"categoryName":"|","doi":"","fpage":"269","id":"a5d48f89-d8b6-44fa-ab59-b15d4983672c","issue":"3","journal":{"abbrevTitle":"MACUK","id":"7f9136b8-b959-42d7-8785-3be75b2fbe9f","issnPpub":"0947-5117","publisherId":"MACUK","title":"Materials and Corrosion-Werkstoffe Und Korrosion"},"keywords":[{"id":"51c84fb6-e836-45db-9755-6c802907c5a4","keyword":"sea-water;electronic-properties;corrosion behavior;oxide-films;alloy;304-stainless-steel;temperature;resistance;aluminum;steel","originalKeyword":"sea-water;electronic-properties;corrosion behavior;oxide-films;alloy;304-stainless-steel;temperature;resistance;aluminum;steel"}],"language":"en","publisherId":"0947-5117_2011_3_1","title":"Effect of hydrostatic pressure on the nature of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> of pure nickel","volume":"62","year":"2011"},{"abstractinfo":"The <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> growth mechanisms of deep rolled bulk nanocrystalline (BN) 304ss and magnetron sputtered nanocrystalline (NC) 304ss thin <span style=\"color:red\">film</span> as well as that of the conventional rolled coarse crystalline (CC) 304ss has been studied by electrochemical measurements and in situ AFM observation in 0.05 M H(2)SO(4) + 0.2 M NaCl solution. The growth of the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> on all three materials was three-dimensional and the growth rates were, in decreasing order: NC thin <span style=\"color:red\">film</span> > BN 304ss > CC 304ss. Also, nanocrystallization caused the nucleation mechanism of the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> to change from progressive to instantaneous. The <span style=\"color:red\">passive</span> films on the CC 304ss and BN 304ss displayed a monolayer structure while that on the NC thin <span style=\"color:red\">film</span> had a multi-layered structure. (C) 2011 Elsevier Ltd. All rights reserved.","authors":[],"categoryName":"|","doi":"","fpage":"7740","id":"8db30b9d-8290-4d10-b70b-1eaaecf3e4eb","issue":"22","journal":{"abbrevTitle":"EA","id":"2eb78e79-f37d-4877-b1cf-473181992a36","issnPpub":"0013-4686","publisherId":"EA","title":"Electrochimica Acta"},"keywords":[{"id":"ee4fa0f0-959d-45da-b55d-d73d06496fad","keyword":"Nanocrystalline materials;In-situ AFM;Growth mechanism;stainless-steel;in-situ;nucleation;corrosion;alloys;afm","originalKeyword":"Nanocrystalline materials;In-situ AFM;Growth mechanism;stainless-steel;in-situ;nucleation;corrosion;alloys;afm"}],"language":"en","publisherId":"0013-4686_2011_22_1","title":"<span style=\"color:red\">Passive</span> <span style=\"color:red\">film</span> growth mechanism of nanocrystalline 304 stainless steel prepared by magnetron sputtering and deep rolling techniques","volume":"56","year":"2011"},{"abstractinfo":"X-ray photoelectron spectroscopy (XPS), potential of zero free charge (PZFC) and double-log of current-time techniques were used to study the effect of nano-scale twins (NT) structure on the chemical component of the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>, the adsorption behavior of chloride ions on the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>, and the passivation formation process in the solution containing 0.02 M NaCl. The results indicated that the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> formed on NT coating was more integrated and more compact than those on IE nickel; the content of Ni(OH)(2) was higher and distribution of various components was more homogeneous across the <span style=\"color:red\">passive</span> films. The negative and smaller value of AE (the difference between the corrosion potential and PZFC) was observed for NT specimen, indicating that the adsorption capability of chloride ions on the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> on NT specimen was markedly attenuated in the solutions. This decreased the susceptibility of NT specimen to pitting corrosion and was consequently responsible for the higher pitting potential. (C) 2009 Elsevier Ltd. All rights reserved.","authors":[],"categoryName":"|","doi":"","fpage":"2575","id":"ea715fdc-2fe7-4c16-a890-196e11d272c8","issue":"7","journal":{"abbrevTitle":"EA","id":"2eb78e79-f37d-4877-b1cf-473181992a36","issnPpub":"0013-4686","publisherId":"EA","title":"Electrochimica Acta"},"keywords":[{"id":"21458efe-3d10-421d-a67d-c6341f15fe5e","keyword":"Nano-scale twins;<span style=\"color:red\">Passive</span> <span style=\"color:red\">film</span>;XPS;Pitting corrosion;Chloride ion;borate buffer solution;stainless-steel;corrosion behavior;pitting;corrosion;high-density;dissolution;metals;alloy;nacl;ni","originalKeyword":"Nano-scale twins;Passive film;XPS;Pitting corrosion;Chloride ion;borate buffer solution;stainless-steel;corrosion behavior;pitting;corrosion;high-density;dissolution;metals;alloy;nacl;ni"}],"language":"en","publisherId":"0013-4686_2010_7_2","title":"Influence of nano-scale twins (NT) structure on <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> formed on nickel","volume":"55","year":"2010"},{"abstractinfo":"The corrosion resistance of a low  concentration chromate <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> for zinc  based alloy coated steel wires was assessed by salt spray and electrochemical corrosion tests. XPS and AES analyses showed that the composition of such chromate <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> was S 5  5, Na 3  4, C 11  8, Ti 7  9, O 41  6, Cr 13  7, Zn 16  0.","authors":[{"authorName":"Y.Li    1)  ","id":"13107840-8f85-461e-9267-f975e065e711","originalAuthorName":"Y.Li    1)  "},{"authorName":"H.R Wang    2)  ","id":"0424db78-25f8-4738-9a2e-92e51d2ea55a","originalAuthorName":"H.R Wang    2)  "},{"authorName":" F.L.Feng    1)  and X.J.Wei    1)    1) POB 118","id":"29d93fce-1b03-4da5-82e5-83f758be4faf","originalAuthorName":" F.L.Feng    1)  and X.J.Wei    1)    1) POB 118"},{"authorName":" Northeastern University","id":"0ba0ad9d-3fba-401a-b54a-db65569f3c20","originalAuthorName":" Northeastern University"},{"authorName":" Shenyang 110006","id":"d50d7899-0e5c-49dc-89c2-18e8fd722e73","originalAuthorName":" Shenyang 110006"},{"authorName":" China  2) Qingdao Branch of Luoyang Ship Material Research Institute","id":"5d5da815-4fda-4ed3-a0bd-f6c35bf848cb","originalAuthorName":" China  2) Qingdao Branch of Luoyang Ship Material Research Institute"},{"authorName":" Qingdao 266071","id":"ac3ba679-e29c-47e2-9039-cf50ea438d49","originalAuthorName":" Qingdao 266071"},{"authorName":" China","id":"44f80646-b037-463d-82ee-b93f8d4cf437","originalAuthorName":" China"}],"categoryName":"|","doi":"","fpage":"736","id":"e2d87353-4f5b-4858-bd5d-4cccc9533b88","issue":"5","journal":{"abbrevTitle":"JSXBYWB","coverImgSrc":"journal/img/cover/amse.jpg","id":"49","issnPpub":"1006-7191","publisherId":"JSXBYWB","title":"金属学报(英文版)"},"keywords":[{"id":"a91c1d31-1c76-43b8-b491-9db154b0e682","keyword":"chromate <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>","originalKeyword":"chromate passive film"},{"id":"c1f940f0-e433-4740-89ea-17f77c5eda24","keyword":"null","originalKeyword":"null"},{"id":"1056d697-6e57-4b9c-81e2-70e8fe7c2d55","keyword":"null","originalKeyword":"null"},{"id":"161ef0ff-e421-49f0-a976-f9741f559577","keyword":"null","originalKeyword":"null"}],"language":"en","publisherId":"1006-7191_1999_5_10","title":"STUDIES OF LOW  CONCENTRATION CHROMATE <span style=\"color:red\">PASSIVE</span> <span style=\"color:red\">FILM</span> FOR ZINC  BASED ALLOY COATED STEEL WIRES","volume":"12","year":"1999"},{"abstractinfo":"alpha -Ti foil with a protective layer formed on one side was deflected during corrosion in a methanol solution containing 0.6 mol/L KCl and then a tensile stress was generated at or near the metal <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> interface. The in situ TEM observation showed that corrosion process could facilitate dislocation emission and motion. Adding 10% H2O into the methanol solution decreased the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>-induced stress from 320 MPa to zero, and the susceptibility to SCC measured in slow strain rate tests decreased correspondingly from 98% to zero.","authors":[{"authorName":"Hong LU","id":"54d3fc96-b1eb-4fc3-916e-4272a310fdeb","originalAuthorName":"Hong LU"},{"authorName":" Kewei GAO","id":"1c0a8f1c-e68b-4e02-9242-5f0948c216b6","originalAuthorName":" Kewei GAO"},{"authorName":" Hui LIU","id":"3f13850c-bc7a-4d24-9338-3caa3d642b26","originalAuthorName":" Hui LIU"},{"authorName":" Lijie QIAO","id":"bc916618-d40a-404e-b370-4fe978943265","originalAuthorName":" Lijie QIAO"},{"authorName":" Wuyang CHU","id":"c66823ba-56a6-422f-b918-5c38bd07c012","originalAuthorName":" Wuyang CHU"}],"categoryName":"|","doi":"","fpage":"413","id":"7c5cd379-1a5c-42f4-94db-f86a1db8b815","issue":"4","journal":{"abbrevTitle":"CLKXJSY","coverImgSrc":"journal/img/cover/JMST.jpg","id":"11","issnPpub":"1005-0302 ","publisherId":"CLKXJSY","title":"材料科学技术（英文）"},"keywords":[],"language":"en","publisherId":"1005-0302_2001_4_7","title":"Stress corrosion cracking and <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>-induced tensile stress in alpha-Ti","volume":"17","year":"2001"},{"abstractinfo":"<span style=\"color:red\">Passive</span> <span style=\"color:red\">film</span> formed on 304 stainless steel in 2.5 mol/L H2SO4 solution by using alternating voltage (A. V.) passivation have been investigated by measuring capacitance and photoelectrochemical parameters. The investigation of the effect of measure frequency on the slope of Mott-Schottky curve has been carried out. The photoelectrochemical measurements were consistent with the capacitance measurement. Analysis of the experimental results showed that the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> formed 304 stainless steel by using A. V. passivation exhibits semiconducting properties. Using the simple model of semiconductor rather than the multi-donor level model can explain satisfactorily the semiconducting behavior of the <span style=\"color:red\">film</span> formed on 304 stainless steel by using A.V. passivation.","authors":[],"categoryName":"|","doi":"","fpage":"30","id":"6b4fedc5-89db-40c6-a376-81ddcbfd6b69","issue":"1","journal":{"abbrevTitle":"ACS","id":"8740b980-5ccc-4edc-a980-54906475d995","issnPpub":"0567-7351","publisherId":"ACS","title":"Acta Chimica Sinica"},"keywords":[{"id":"ef7f4fc5-e9e1-4365-919c-84d26957d9db","keyword":"A. V. passivation;<span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>;semiconducting properties;stainless;steel;model;electrodes","originalKeyword":"A. V. passivation;passive film;semiconducting properties;stainless;steel;model;electrodes"}],"language":"en","publisherId":"0567-7351_2002_1_1","title":"Semiconducting properties of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> formed on stainless steel by using A. V. passivation","volume":"60","year":"2002"},{"abstractinfo":"The chemical composition and semi-conductive properties of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> on nickel-based alloy (G3 alloy) in bicarbonate/carbonate buffer solution were investigated by Auger spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), electrochemical impedance spectra (EIS) and Mott-Schottky plot. AES and XPS results showed that the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> appeared double-layer, in which the inner <span style=\"color:red\">film</span> was composed of nickel oxide, the mixed nickel-chromium-molybdenum-manganese oxides were the major component of the outer <span style=\"color:red\">film</span>. The electrochemical results revealed that the factors including frequency, potential, time, temperature and pH value can affect the semi-conductive property, the doping densities decreased with increasing potential and pH value, prolonging time, and decreasing temperature. According to the above results, it can be concluded that the <span style=\"color:red\">film</span> protection on the substrate enhanced with increasing potential and pH value, prolonging time, and decreasing temperature.","authors":[{"authorName":"Dangguo LI","id":"0d488adf-5133-47ab-abd0-faf26af88107","originalAuthorName":"Dangguo LI"}],"categoryName":"|","doi":"","fpage":"461","id":"cc7821c9-74e8-4e43-a9c7-839ccdd64da0","issue":"6","journal":{"abbrevTitle":"JSXBYWB","coverImgSrc":"journal/img/cover/amse.jpg","id":"49","issnPpub":"1006-7191","publisherId":"JSXBYWB","title":"金属学报(英文版)"},"keywords":[{"id":"c0248564-4aed-4049-94ff-bfe554381603","keyword":"Nickel-based alloy","originalKeyword":"Nickel-based alloy"},{"id":"eb5aa8b8-76e4-45de-8d2a-2aee5a92d4ea","keyword":"俄歇分析","originalKeyword":"俄歇分析"},{"id":"053b8db4-92ea-411d-b829-2189f1c80e76","keyword":"X-射线光电子能谱","originalKeyword":"X-射线光电子能谱"},{"id":"ad6c474c-07b2-44bc-9222-fe84f5bb669e","keyword":"电化学阻抗谱","originalKeyword":"电化学阻抗谱"},{"id":"37e09ab7-e820-4a83-b2fb-3c6318d52b5f","keyword":"Mott-Schottky曲线","originalKeyword":"Mott-Schottky曲线"}],"language":"en","publisherId":"1006-7191_2010_6_6","title":"Chemical composition and Mott-Schottky analysis of <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> formed on G3 alloy in bicarbonate/carbonate buffer solution","volume":"23","year":"2010"},{"abstractinfo":"<span style=\"color:red\">Passive</span> films formed on sensitized stainless steel in sulphuric acid solutions have been studied using photoefectrochemical techniques. The results of the photocurrent measurement indicate that the <span style=\"color:red\">passive</span> films on sensitized stainless steel are characterised with n-type or p-type semiconductor in different potential regions. The difference in the photoelectrochemical behaviour can be interpreted assuming that the <span style=\"color:red\">passive</span> <span style=\"color:red\">film</span> is an iron-chromium oxide solid solution associated with various hydration degrees of the Cr(Ⅲ) oxides at various potentials","authors":[{"authorName":"Tianbao DU and Shenhao CHEN (Chemistry Dept.","id":"ae68c32f-eb88-48ce-8b72-2e210d437fa1","originalAuthorName":"Tianbao DU and Shenhao CHEN (Chemistry Dept."},{"authorName":" Shandong University","id":"0c027d67-1ce1-4a9c-91e6-5b9c978e8ad2","originalAuthorName":" Shandong University"},{"authorName":" Jinan 250100","id":"898bc105-d1e8-4334-951f-e6f3096887e1","originalAuthorName":" Jinan 250100"},{"authorName":" China)Maizhi YANG and Li CHEN (Chemistry Dept.","id":"52839c57-bd52-4d28-8f78-3340d1c28241","originalAuthorName":" China)Maizhi YANG and Li CHEN (Chemistry Dept."},{"authorName":" Peking University","id":"43e45f00-ddd8-4db2-9ba9-8f708b4c53be","originalAuthorName":" Peking University"},{"authorName":" Beijing 100871","id":"8abf7567-7f5b-4637-9051-67e025a5e963","originalAuthorName":" Beijing 100871"},{"authorName":" China)","id":"d6b396eb-27c3-4c34-b9df-72ee7d1916c8","originalAuthorName":" China)"}],"categoryName":"|","doi":"","fpage":"381","id":"468d9724-24e6-4d79-b29e-3f59261a061d","issue":"5","journal":{"abbrevTitle":"CLKXJSY","coverImgSrc":"journal/img/cover/JMST.jpg","id":"11","issnPpub":"1005-0302 ","publisherId":"CLKXJSY","title":"材料科学技术（英文）"},"keywords":[],"language":"en","publisherId":"1005-0302_1996_5_7","title":"Photoelectrochemical Study of <span style=\"color:red\">Passive</span> Films on Sensitized Stainless Steel","volume":"12","year":"1996"},{"abstractinfo":"Using capacitance measurement and Mott-Schottky analysis, the semiconducting properties of <span style=\"color:red\">passive</span> films formed on chromium within the <span style=\"color:red\">passive</span> potential range under different conditions were investigated. The study reveals a p-type behavior of the <span style=\"color:red\">passive</span> layers. Two semiconductive parameters, i.e., the acceptor density (N-A) and the flatband potential (E-FB), which are mainly related to composition and surface charges of the <span style=\"color:red\">passive</span> films, have been measured. The effect of <span style=\"color:red\">film</span> formation potential, passivation time, pH and composition of solutions on the parameters are discussed. N-A increases either with lowering <span style=\"color:red\">film</span> formation potentials or with prolonging passivation times. This is attributed to the transformation of a less hydrated oxide <span style=\"color:red\">film</span> into a more hydrated form. The changes of E-FB are discussed as a function of adsorptive anions and pH values of electrolyte solution. (C) 2002 Elsevier Science Ltd. All rights reserved.","authors":[],"categoryName":"|","doi":"","fpage":"747","id":"166424a5-d0c4-4824-bb75-afd2afdc27d7","issue":"4","journal":{"abbrevTitle":"CS","id":"36011533-0ced-443e-899a-7c7323dae3b5","issnPpub":"0010-938X","publisherId":"CS","title":"Corrosion Science"},"keywords":[{"id":"78b218e0-f327-4c1d-962f-8e795a3ca8b3","keyword":"chromium;<span style=\"color:red\">passive</span> <span style=\"color:red\">film</span>;capacitance;acceptor density;flatband;potential;specific adsorption;electron-transfer reactions;semiconducting properties;stainless-steels;alloying elements;defect structure;iron;impedance;ellipsometry;stability;surfaces","originalKeyword":"chromium;passive film;capacitance;acceptor density;flatband;potential;specific adsorption;electron-transfer reactions;semiconducting properties;stainless-steels;alloying elements;defect structure;iron;impedance;ellipsometry;stability;surfaces"}],"language":"en","publisherId":"0010-938X_2003_4_1","title":"A study of the <span style=\"color:red\">passive</span> films on chromium by capacitance measurement","volume":"45","year":"2003"}],"totalpage":128,"totalrecord":1271}