Kewei XU Jiawen HE Huijiu ZHOU Research Institute for Strength of Metals
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Xi'an Jiaotong University
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Xi'an
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710049
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China
材料科学技术(英文)
The measurement of internal stresses in a PACVD TiN film proved experimentally to be difficult by a conventional X-ray diffraction technique.The linear relationship between 2θ and sin~2(?) could hardly be reached in some cases.Nevertheless.a good confirmation between the variation of FWHM-sin~2(?) and 20-sin~2(?) was revealed for every nonlinear forms.It followed that the effect of nondistributed micro-strains might exist in plasma assisted vapor deposited films,which usually have a strong crystal orientation,and the method of effectively separating macro-stress and micro-strain must be applied for the precise determination of internal stresses in PACVD films.
关键词:
TiN film
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