M.H. Li
金属学报(英文版)
Ta / NiFe/ Bi （Ag, Cu）/ FeMn /Ta and Ta / NiFeI /FeMn / Bi（Ag, Cu）/ NiFeII / Ta films were prepared by magnetic sputtering. The texture and the dependences of the exchange-coupling field on the thickness of Bi, Ag, and Cu in Ta / NiFe/ Bi（Ag, Cu） /FeMn /Ta and Ta/ NiFeI / FeMn / Bi（Ag, Cu）/ NiFeII / Ta films were studied. XPS results indicate that the Bi atoms migrated into the FeMn layer during the deposition process and a FeMnBi alloy was probably formed or the Bi atoms existed as an impurity in the FeMn layer in Ta / NiFe / Bi（Ag, Cu）/ FeMn / Ta. Otherwise, in Ta / NiFeI / FeMn / Bi（Ag, Cu） / NiFeII / Ta films, Bi, Ag, and Cu atoms do not remain entirely at the interface of the FeMn / NiFeII film, but at least partly segregate to the surface of the NiFe film.
关键词:
iFe/FeMn
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M.H. Li
,
G.H. Yu
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F.W. Zhu
金属学报(英文版)
The exchange bias field of NiFe/FeMn films with Ta/ Cu buffer was proved to be lowerthan that of the films with Ta buffer. The crystallographic texture, surface roughnessand elements distribution were examined in these two sets of samples, and there isno apparent difference for the texture and roughness. However, the segregation ofCu atoms above NiFe surface in the maltilayer of Ta/Cu/NiFe has been observed byusing the angle-resolved X-ray photoelectron spectroscopy (XPS). The decrease of theexchange bias field for NiFe/FeMn films with Ta/ Cu buffer layers is mainly causedby the Cu atoms segregation at the interface between NiFe and FeMn.
关键词:
NiFe/FeMn
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