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Failure Modes of Lead Free Solder Bumps Formed by Induction Spontaneous Heating Reflow

Mingyu LI , Hongbo XU

材料科学技术(英文)

The shear failure modes and respective failure mechanism of Sn3.5Ag and Sn3.0Ag0.5Cu lead-free solder bumping on Au/Ni/Cu metallization formed by induction spontaneous heating reflow process have been investigated through the shear test after aging at 120±C for 0, 1, 4, 9 and 16 d. Different typical shear failure behaviors have been found in the loading curves (shear force vs displacement). From the results of interfacial morphology analysis of the fracture surfaces and cross-sections, two main typical failure modes have been identified. The probabilities of the failure modes occurrence are inconsistent when the joints were aged for different times. The evolution of the brittle Ni3Sn4 and Cu-Ni-Au-Sn layers and the grains coarsening of the solder bulk are the basic reasons for the change of shear failure modes.

关键词: Induction spontaneous heating reflow , Self , Heat , Reflow , lead , free , sol

Role of grain orientation in the failure of Sn-based solder joints under thermomechanical fatigue

Jing HAN , Hongtao CHEN , Mingyu LI

金属学报(英文版)

A small Pb-free solder joint exhibits an extremely strong anisotropy due to the body-centered tetragonal (BCT) lattice structure of β-Sn. Grain orientations can significantly influence the failure mode of Pb-free solder joints under thermomechanical fatigue (TMF) due to the coefficient of thermal expansion (CTE) mismatch of β-Sn grains. The research work in this paper focused on the microstructure and damage evolution of Sn3.0Ag0.5Cu BGA packages as well as individual Sn3.5Ag solder joints without constraints introduced by the package structure under TMF tests. The microstructure and damage evolution in cross-sections of solder joints under thermomechanical shock tests were characterized using optical microscopy with cross-polarized light and scanning electron microscopy (SEM), and orientations of Sn grains were determined by orientation imaging microscopy (OIM). During TMF, obvious recrystallization regions were observed with different thermomechanical responses depending on Sn grain orientations. It indicates that substantial stresses can build up at grain boundaries, leading to significant grain boundary sliding. The results show that recrystallized grains prefer to nucleate along pre-existing high-angle grain boundaries and fatigue cracks tend to propagate intergranularly in recrystallized regions, leading to an accelerated damage after recrystallization.

关键词: Pb-free solder , null , null , null , null

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