Y. D. Liu
,
G. Wang
,
C.S. He
,
Y.D. Whng and J.Z. Xu (Department of Materials Science and Engineering
,
Northeastern University
,
Shenyang 110006
,
China)
金属学报(英文版)
In view of being difficult to find a non-oriented multilayer specimen, the precise defocusing correction become a particular obstacle of quantitative texture analyszs of the multzlayer. A new method is employed in this paper for comcting the eoperzment data. And a theoretical calculation for the defocus curre is proposed thinking about both thc dtherent film thickness and the penetration depth of the incident beam in the films. A critical value jor the defocusing cormction in the film is alsi cinsidered. This new tcchnique is applied to the Zn-Cu multilayer for which the quantitative texture analysis is completed by the modified maxitnum entropy tnethod.
关键词:
multilayer
,
null
,
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