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CHARACTERIZATION OF NANOSTRUCTURED MATERIALS BY ANALYTICAL ELECTRON MICROSCOPY

L.D. He , G.Y Zeng , X.Liu H.S. Hu , D.Song and L.Z.Cheng(Electron Microscope Laboratory Northeastern University Shenyang 110006 , ChinaManuscript received 20 July 1995 , in revised form 10 April 1996)

金属学报(英文版)

The analytical electron microscopy has been used to characterize the morphology,structure and composition of the nanostructured material of Sn- Bi alloy prepared by a modified electrohydrodynamic technique. The electron diffraction pattern and the corresponding contrast image for the discrete particles with a diameter smaller than 4 nm have been obtained.It is shown that the nanocrystalline Sn-Bi alloy particles comprise a single crystal of Bi-containing β-Sn solid solution or of Sn-containing Bi solid solution. A direct preparation procedure of the samples during the electrohydrodynamic rapid solidification process has been developed for electron microscopic observation.

关键词: :nanostructured material , null , null , null

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