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Influences of Similar Elements on Glass Forming Ability and Magnetic Properties in Al-Ni-La Amorphous Alloy

Guihua Li

材料科学技术(英文)

Similar element substitution has been applied for improving glass forming ability (GFA) in Al86Ni9La5 amorphous alloy. The effects of La-Ce and Ni-Co pairs on the GFA, magnetic properties and hardness of Al-Ni-La alloy were investigated by using X-ray diffraction (XRD), transmission electron microscopy (TEM), differential scanning calorimetry (DSC), magnetometer and hardness-tester. The results show the GFA of the samples in the order of Al86(Ni0:5Co0:5)9(La0:5Ce0:5)5< Al86Ni9La5<Al86Ni9(La0:5Ce0:5)5, implying that similar element substitution has a limited enhancing effect on the GFA of the present Al-Ni-La alloy. In addition, the measured samples display a diamagnetic behavior at room temperature. The variations of diamagnetic behavior as well as the microhardness of the samples are strongly dependent on the  icrostructure, i.e., the amounts of the icosahedral structure and precipitates, after the similar element substitution in the Al-Ni-La alloy.

关键词: X-ray diffraction (XRD) , null , null , null

Influence of Sputtering Gas on Morphological and Optical Properties of Magnesium Films

Yogendra K. Gautam Amit K. Chawla Vipin Chawla R.D. Agrawal

材料科学技术(英文)

The influence of sputtering gas (He & Ar) on the structural properties of Mg thin films has been investigated. The optical property (reflectance) that results from the growth of films at varying substrate temperatures (Tsub) was also studied. The deposited films were characterized by using X-ray diffraction (XRD), field emission scaning electron microscopy (FE-SEM), atomic force microscopy (AFM) and UV-Vis-NIR spectrophotometer. The smaller crystallite size and lower deposition rate were observed in the presence of Helium atmosphere compared to Argon. Morphology of the films shows 2D hexagonal geometry of grains in the deposition temperature range (Tsub≈50−150°C) in both the sputtering gases. The surface roughness of the polycrystalline films were found to increase with increase in the deposition temperature of both ambient gases. Optical reflectance of Mg films was measured in near infrared region and larger reflectance was observed from Mg films sputtered in He atmosphere compared to that in argon.

关键词: X-ray diffraction (XRD) , XRD , Atomic Force Microscope (AFM) , Reflectance

Geometric Effects of La1+xMg2-xNi9 (x=0.02~1.0) Ternary Alloys on Their Hydrogen Storage Capacities

Zhiqing YUAN , Guanglie LU , Bin LIAO , Yongquan LEI

材料科学技术(英文)

Structural analysis was made using X-ray diffraction (XRD) Rietveld refinement on a series of La1+xMg2-xNi9 (x=0.02~1.0) ternary alloys. Results showed that each of La1+xMg2-xNi9 alloys was a PuNi3-type structure stacked by LaNi5 and (La, Mg) Ni2 blocks. Electrochemical tests revealed that discharge abilities of these La-Mg-Ni ternary alloys mainly depended on their atomic distances between (La, Mg) and Ni, which could be modified by varying the atomic ratios of La/Mg.

关键词: Hydrogen storage alloy , null , null , null

湿法炼锌浸出渣和黄钾铁矾渣的鉴别

唐梦奇 , 阮贵武 , 刘国文 , 张庆建

冶金分析 doi:10.13228/j.boyuan.issn1000-7571.009846

湿法炼锌浸出渣和黄钾铁矾渣是湿法炼锌工艺中常见的固体废物,且均为我国禁止进口的固体废物。这两种固体废物中锌含量较高,常冒充锌精矿向我国进口。因此实验针对湿法炼锌浸出渣和黄钾铁矾渣进行鉴别,首先利用X射线荧光光谱仪( XRF)对制得粉末样品中的元素进行分析,结果表明,湿法炼锌浸出渣的主要元素为Fe、Zn,黄钾铁矾渣的主要元素为Fe、S、Zn,且湿法炼锌浸出渣和黄钾铁矾渣中均含有As、Cd、Ga、In、Ag等元素。再利用X射线衍射仪( XRD)对粉末样品中存在的物相进行分析,湿法炼锌浸出渣的主要物相为Zn-Fe2O4,并含有少量 PbSO4、Zn2SiO4、ZnS,黄钾铁矾渣的主要物相为KFe3(SO4)2(OH)6、Zn-Fe2 O4、Zn2 SiO4。实验建立的湿法炼锌浸出渣和黄钾铁矾渣的鉴别方法为进口固体废物的监管提供了技术支持。

关键词: , 湿法炼锌浸出渣 , 黄钾铁矾渣 , 固体废物 , 鉴别 , X射线荧光光谱 , X射线衍射

硼碳氮薄膜的制备与表征

刘振良 , 廖志君 , 范强 , 杨水长 , 伍登学 , 卢铁城

稀有金属材料与工程

用电子束蒸发的方法在单晶硅(100)基片上制备了硼碳氮薄膜,通过椭圆偏振仪、X射线衍射仪(XRD)、X光电子能谱仪(XPS)、傅立叶红外光谱仪(FTIR),测试分析了薄膜厚度均匀性、成分与结构.结果表明,薄膜均匀性较好,薄膜的沉积速率非常慢;薄膜在衬底温度为常温下沉积已是晶态的,随着衬底温度升高到450 ℃,其结晶性逐渐增强;薄膜不是石墨与BN的混和膜而是C、B、N相互结合成键.

关键词: 硼碳氮薄膜 , XPS , XRD , FTIR

硫化镍试金扣成分探讨

汪小妹 , 曾志刚 , 殷学博 , 王晓媛 , 袁春伟 , 张国良

贵金属 doi:10.3969/j.issn.1004-0676.2007.04.010

实验对比了熔剂中硫和镍的质量(mS和mNiO)变化对镍扣质量(mbutton)的影响,结果表明:mbutton主要受mNiO的控制,mS的变化对其影响则较小.采用X射线衍射(XRD)分析了6个不同mS、mNiO的熔剂所制备镍扣的矿物成分,结果显示:镍扣矿物成分单一,以Ni3S2为主,含少量NixS6,不含NiS、Ni3S4和NiS2等矿物.改变所加入的mS和mNiO,镍扣的矿物组成并不改变,仅是Ni3S2和NixS6相对含量发生变化.

关键词: 分析化学 , 铂族元素 , 硫化镍试金扣 , X射线衍射 , 矿物 , Ni3S2

薄壁Ti6Al4V管件采用不同车削参数加工引起的表面残余应力的测量

孟龙晖 , 何宁 , 杨吟飞 , 赵威

稀有金属材料与工程

同时考虑测量精度、测量可行性以及节约材料诸多方面的问题,运用有限元验证的方法确定零件合适的长度.同时运用精度较高的基于有限元分析的修正方法结合X射线法测量Ti6Al4V管件车削加工引起的表面残余应力,分析不同切削参数以及退火处理对表面残余应力的影响.结果显示:切削速度、进给量以及切削深度在指定范围内增大时会导致表面切削和进给方向的压应力增大,退火处理会使得表面2个方向的残余应力减小将近85%.

关键词: 残余应力 , 修正 , 腐蚀 , 有限元分析 , X射线衍射

GaAs/Si(100)异质外延4°偏角衬底对外延层结晶质量的提高

熊德平 , 罗莉 , 雷亮 , 陈志新

功能材料与器件学报 doi:10.3969/j.issn.1007-4252.2010.03.001

用低压金属有机物化学汽相沉积法(MOCVD)在Si(100)无偏角和Si(100)4°偏角衬底上外延生长GaAs层.异质外延采用两步生长法,并分别优化了两种衬底上的非晶低温缓冲层的生长条件.用X射线双晶衍射(XRD)和透射电子显微镜(TEM)对两种衬底上的GaAs外延层进行了结构表征,其中Si(100)4°偏角衬底上1.8μm厚GaAs的(004)面XRD衍射半高全宽338 arcsec,同比在无偏角衬底上的半高全宽为494arcsec,TEM图片显示4°偏角衬底上外延层中的位错密度大大降低.

关键词: GaAs/Si异质结 , X射线衍射(XRD) , 透射电子显微镜(TEM)

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