{"currentpage":1,"firstResult":0,"maxresult":10,"pagecode":5,"pageindex":{"endPagecode":5,"startPagecode":1},"records":[{"abstractinfo":"建立了一套门控闪烁测量系统门控ST-PMT系统),测量了稠密等离子体聚焦(DPF)波形后沿中子峰下3~4个量级的物理图像,分别讨论了长电缆对DPF D-D,D-T中子峰下3~4个量级波形测量的影响,采用数学方法分析了长电缆作为频率滤波函数在解逆卷积函数中的应用,解析了电缆带宽对测量结果的影响。","authors":[{"authorName":"郭洪生","id":"23c9e543-9e10-4e03-af26-d9b92a783072","originalAuthorName":"郭洪生"},{"authorName":"李如荣","id":"f7d270be-7eaa-4e33-b07b-57b295d995db","originalAuthorName":"李如荣"},{"authorName":"唐登攀","id":"075c4e26-1de7-4344-ba41-a7193ad5bc43","originalAuthorName":"唐登攀"},{"authorName":"杨高照","id":"a1ba2e93-160f-4405-ab41-cf4d4491e769","originalAuthorName":"杨高照"},{"authorName":"胡青元","id":"575dc610-1e06-439f-ab48-16766f8a7554","originalAuthorName":"胡青元"},{"authorName":"司粉妮","id":"a6f8765f-f2fc-4756-a188-5102c1e6d2da","originalAuthorName":"司粉妮"},{"authorName":"张建华","id":"b155df85-fbed-47e2-afcf-6f1ed901e231","originalAuthorName":"张建华"},{"authorName":"彭太平","id":"38ce6251-db45-4422-affa-1dc173f44fd2","originalAuthorName":"彭太平"}],"doi":"","fpage":"469","id":"a08987dd-6db5-4c11-9ce5-db6ca70fbd88","issue":"4","journal":{"abbrevTitle":"YZHWLPL","coverImgSrc":"journal/img/cover/YZHWLPL.jpg","id":"78","issnPpub":"1007-4627","publisherId":"YZHWLPL","title":"原子核物理评论 "},"keywords":[{"id":"f2c132db-e3b2-4d5a-81c4-99fab824e5e9","keyword":"稠密等离子体聚焦","originalKeyword":"稠密等离子体聚焦"},{"id":"d1d5674b-4708-4cd8-b982-e2ba99461489","keyword":"长电缆滤波","originalKeyword":"长电缆滤波"},{"id":"048b9ada-6afe-42f2-a22a-bec606a67a36","keyword":"逆卷积","originalKeyword":"逆卷积"},{"id":"f3cd02ba-5691-4dd1-be9f-13cd06da79ca","keyword":"中子峰后沿测量","originalKeyword":"中子峰后沿测量"},{"id":"37580d19-8040-4419-a30c-130eda55e338","keyword":"门控闪烁测量系统","originalKeyword":"门控闪烁测量系统"}],"language":"zh","publisherId":"yzhwlpl201104016","title":"DPF中子峰下波形测量数据计算中长电缆滤波影响的研究","volume":"28","year":"2011"},{"abstractinfo":"为适应在n、γ混合脉冲辐射场中对低强度快脉冲γ辐射测量的需要,近年国内新研制出实用型YAlO3:Ce(YAP:Ce)快响应无机闪烁晶体.我们使用脉冲线性电流大于1.5 A的光电倍增管,分别配置这种晶体以及CeF3、NaI等晶体构成闪烁探测器,在放射性标准源场中,对晶体的相对探测能力进行测量.测量结果表明:国产新型YAP:Ce无机晶体对这1.25 MeV 射线的探测能力比同体积的CeF3平均高一个量级,是同体积NaI的40%左右;当晶体厚度小于2 mm时,YAP:Ce与CeF3、NaI的输出比值分别大于16和44%,说明厚度越薄晶体的相对探测能力越强.","authors":[{"authorName":"胡孟春","id":"4096fc5c-bee9-4319-8c80-712383b4eb72","originalAuthorName":"胡孟春"},{"authorName":"李忠宝","id":"b3871acb-eee3-421b-b03d-ee9cb45a2dd9","originalAuthorName":"李忠宝"},{"authorName":"周刚","id":"1ecda389-7a56-4c44-973f-81059ba42ec8","originalAuthorName":"周刚"},{"authorName":"张建华","id":"9e110c79-551f-4d5b-95c5-0fe7e63a09a6","originalAuthorName":"张建华"},{"authorName":"赵广军","id":"ca8a0e6d-4193-4290-848b-bbc035a9a241","originalAuthorName":"赵广军"},{"authorName":"彭太平","id":"61afe39d-3d4e-499d-91e7-73a9333b1ebf","originalAuthorName":"彭太平"},{"authorName":"王振通","id":"9f4fc14e-430c-4252-8027-38eb7741ac4a","originalAuthorName":"王振通"},{"authorName":"唐章奎","id":"6fd02b18-3ee4-44d1-8df4-8a299840e0b4","originalAuthorName":"唐章奎"},{"authorName":"杨高照","id":"02038b61-622f-40cf-9494-97b6c2a4f883","originalAuthorName":"杨高照"},{"authorName":"李如荣","id":"1461e9b1-34d7-4ab0-b40a-4562fdd11820","originalAuthorName":"李如荣"},{"authorName":"唐登攀","id":"e46dd61b-baa7-43ac-b148-2fff78decfa8","originalAuthorName":"唐登攀"},{"authorName":"陈钰钰","id":"7eb85f5b-70da-499b-a067-df4dfc474c57","originalAuthorName":"陈钰钰"}],"doi":"","fpage":"1458","id":"7ad9819a-3120-48d8-836d-b11a0d0375b7","issue":"6","journal":{"abbrevTitle":"RGJTXB","coverImgSrc":"journal/img/cover/RGJTXB.jpg","id":"57","issnPpub":"1000-985X","publisherId":"RGJTXB","title":"人工晶体学报"},"keywords":[{"id":"b99c5c7b-b71c-46e7-9ef7-b0213bcb8ce1","keyword":"YAlO3","originalKeyword":"YAlO3"},{"id":"03e61917-c6c0-4feb-bfc0-a3acc5fbcef4","keyword":"Ce","originalKeyword":"Ce"},{"id":"521fc426-e32f-4b62-a4af-68d767f92ef7","keyword":"YAP","originalKeyword":"YAP"},{"id":"eaed4660-829d-47d9-bc2d-18c9ea92b48e","keyword":"Ce","originalKeyword":"Ce"},{"id":"66823627-6264-4a04-9dcb-127dc81d2b48","keyword":"无机闪烁体","originalKeyword":"无机闪烁体"},{"id":"adc545a4-73b8-44cf-8fc5-6a96878ec182","keyword":"辐射探测","originalKeyword":"辐射探测"}],"language":"zh","publisherId":"rgjtxb98200806031","title":"国产YAP:Ce闪烁晶体的相对探测能力测量","volume":"37","year":"2008"},{"abstractinfo":"以国产的掺铈氯化镧(LaCl3:Ce)闪烁晶体与线性电流大于1.5 A的光电倍增管构成闪烁探测器,利用 60Co、137Cs放射性标准源场,实验测量这种探测器对γ辐射的探测能力,并与同情况NaI:Tl闪烁探测器进行比对;利用266 nm单色激光和ns级的γ脉冲辐射分别对这种闪烁体的光致激发、辐射激发的时间响应性能进行测量.测量结果表明:国产新型LaCl3:Ce无机闪烁晶体样品构成的探测器对1.25 MeV 、0.66 MeV γ射线的探测能力平均约为同情况NaI:Tl闪烁探测器的103%,高的已超过了同尺寸NaI:Tl构成的闪烁探测器;266 nm单色激光光致激发时间响应波形前沿、半高宽、后沿和衰减常数分别为1.05 ns、17.42 ns、54.30 ns和24.61 ns,ns级的γ脉冲辐射激发的时间响应波形前沿、半高宽、后沿和衰减常数分别为1.52 ns、21.99 ns、75.13 ns和34.19 ns.","authors":[{"authorName":"胡孟春","id":"1f7a7a62-f4df-4c42-97c9-658c45fb6314","originalAuthorName":"胡孟春"},{"authorName":"周刚","id":"20fd30e1-63e9-4cff-aef2-dbd20eac0cef","originalAuthorName":"周刚"},{"authorName":"李忠宝","id":"ef76f694-6a95-42f7-b6ee-863d749337df","originalAuthorName":"李忠宝"},{"authorName":"张建华","id":"934feb09-8a02-49b3-8fce-b97e5ff3ea24","originalAuthorName":"张建华"},{"authorName":"张明荣","id":"0086662b-7238-4ae4-a512-dccdeb74ba26","originalAuthorName":"张明荣"},{"authorName":"彭太平","id":"19b99fe4-6f71-4760-bcf2-9f275844ceed","originalAuthorName":"彭太平"},{"authorName":"唐章奎","id":"3aae8de0-faa6-4b6a-af4a-ecd4b5804096","originalAuthorName":"唐章奎"},{"authorName":"胡青元","id":"752bfcaa-38d1-4f89-b41b-2fc1d31e20cb","originalAuthorName":"胡青元"},{"authorName":"司粉妮","id":"d9d07008-f945-43c7-99fd-006df7b96110","originalAuthorName":"司粉妮"}],"doi":"","fpage":"481","id":"f582d258-9cca-4598-b5ac-d201c95f309b","issue":"2","journal":{"abbrevTitle":"RGJTXB","coverImgSrc":"journal/img/cover/RGJTXB.jpg","id":"57","issnPpub":"1000-985X","publisherId":"RGJTXB","title":"人工晶体学报"},"keywords":[{"id":"819fa163-3b0c-4ea4-8d2f-6671b066f3be","keyword":"LaCl3:Ce","originalKeyword":"LaCl3:Ce"},{"id":"e7f5a4a5-1fbb-4977-a45f-cf496c3cb6ef","keyword":"NaI:Tl","originalKeyword":"NaI:Tl"},{"id":"4767ecf3-7b3b-4ade-beae-a20dadf5de17","keyword":"无机闪烁体","originalKeyword":"无机闪烁体"},{"id":"ba77179c-807b-4347-8c8b-42b904ebf013","keyword":"辐射探测","originalKeyword":"辐射探测"},{"id":"6424bf10-21b4-4c01-8148-9135bed5e0b6","keyword":"探测器","originalKeyword":"探测器"}],"language":"zh","publisherId":"rgjtxb98201002041","title":"国产无机闪烁晶体LaCl3:Ce的探测能力和时间响应测量","volume":"39","year":"2010"},{"abstractinfo":"利用几种单能γ源对BC501A型液体闪烁体探测器进行能量刻度,以得到探测器对电子的光输出响应函数.介绍了用蒙特卡罗模拟法确定康普顿边缘所对应的电子能量的方法,得到的结果与用半高点确定康普顿边缘方法所得的结果做了比较.利用德国PTB开发的PHRESP蒙特卡罗程序计算出液体闪烁体探测器对各种单能γ射线的光响应矩阵,阐述了利用γ射线响应函数矩阵和γ射线的反冲电子谱求解待测γ能谱的原理,对解谱的误差来源也进行了简要的分析.","authors":[],"doi":"","fpage":"136","id":"b3d5cbee-246d-4a7d-8c54-1a1d6ed216b3","issue":"2","journal":{"abbrevTitle":"YZHWLPL","coverImgSrc":"journal/img/cover/YZHWLPL.jpg","id":"78","issnPpub":"1007-4627","publisherId":"YZHWLPL","title":"原子核物理评论 "},"keywords":[{"id":"97ef8694-643b-498d-be07-93a0b42c0a22","keyword":"液体闪烁体探测器","originalKeyword":"液体闪烁体探测器"},{"id":"df415d70-de24-4714-9f48-1fce28a29ef4","keyword":"光响应函数","originalKeyword":"光响应函数"},{"id":"bca4d1cf-de80-4f08-b97f-f8c82557f85f","keyword":"γ能谱","originalKeyword":"γ能谱"},{"id":"1e850686-77a4-4717-b9da-44e1eb7d6490","keyword":"SAND-II迭代方法","originalKeyword":"SAND-II迭代方法"}],"language":"zh","publisherId":"yzhwlpl200902009","title":"液体闪烁体探测器γ射线测量研究","volume":"26","year":"2009"},{"abstractinfo":"用波长为266nm的激光激发不同尺寸、不同掺Ce3+浓度的YAP:Ce闪烁晶体,测量其光致激光荧光衰减常数,测量结果表明:YAP:Ce闪烁晶体的光致荧光衰减常数约为18.2ns,且与实验晶体厚度及Ce3+掺杂浓度(0.1%~0.6%原子分数)无关.","authors":[{"authorName":"张建华","id":"1548fc31-7e0d-4be6-be16-ecf4a2e6cd7b","originalAuthorName":"张建华"},{"authorName":"彭太平","id":"0359dfd5-eb5a-4f9e-b187-8eb36395a159","originalAuthorName":"彭太平"},{"authorName":"胡孟春","id":"900ac5be-dd15-408c-993f-b244401c9c70","originalAuthorName":"胡孟春"},{"authorName":"王振通","id":"6ee52736-8ab8-457c-871b-8db24d778a2d","originalAuthorName":"王振通"},{"authorName":"赵广军","id":"a1890cd7-b2e6-4db3-9c03-f824c8a359a1","originalAuthorName":"赵广军"}],"doi":"10.3969/j.issn.1000-985X.2006.05.030","fpage":"1057","id":"f7064e5f-3491-4432-a86f-57f148b1df19","issue":"5","journal":{"abbrevTitle":"RGJTXB","coverImgSrc":"journal/img/cover/RGJTXB.jpg","id":"57","issnPpub":"1000-985X","publisherId":"RGJTXB","title":"人工晶体学报"},"keywords":[{"id":"43714cf1-208f-4185-8466-46772b5cbd0f","keyword":"YAP:Ce闪烁晶体","originalKeyword":"YAP:Ce闪烁晶体"},{"id":"784a1c23-f749-4994-9fc4-932df579ba57","keyword":"激光","originalKeyword":"激光"},{"id":"cd618526-1c7c-4053-a755-ea317f6dc1e7","keyword":"衰减常数","originalKeyword":"衰减常数"},{"id":"d9671b9f-555b-4a78-9346-2f89b05f3dda","keyword":"指数拟合","originalKeyword":"指数拟合"}],"language":"zh","publisherId":"rgjtxb98200605030","title":"YAP:Ce闪烁晶体的光致激发荧光衰减常数测量","volume":"35","year":"2006"},{"abstractinfo":"为了给强脉冲辐射场中应用超快闪烁探测器进行精密物理测试以及相关晶体抗核加固提供实验测量数据参考,针对近年新研制的Yb∶ YAG超快无机闪烁体与GD40光电管构成的快闪烁探测器,在源强近万居的强稳态辐照场中,细致测量了辐射累计伽马剂量从约1 Gy开始到最高约1 kGy全过程中Yb∶ YAG超快闪烁探测器输出电流的变化数据;在测点注量率大于1017cm-2·s-1的“强光一号”短γ脉冲辐射场中,测量了Yb∶ YAG超快闪烁探测器输出脉冲波形响应情况.实验测量结果表明:在强稳态辐射场情况下,对应累计剂量5 ~ 10Gy时,YAG(Yb)闪烁探测器灵敏度下降约5~10%(相对辐照IGy时的情况);测点累计伽马剂量约1 kGy时,Yb∶ YAG超快闪烁探测器的电流输出与约1 Gy时的比值约50%;短γ脉冲辐射情况下,测点累计注量约4×109 cm-2,Yb∶ YAG超快闪烁探测器输出电流约1A时,灵敏度下降约10%(相对累计注量约3×109 cm-2的情况),当测点注量大于1010 cm-2(累积剂量超过100 mGy),Yb∶ YAG超快闪烁探测器会出现较明显的损伤现象.","authors":[{"authorName":"胡孟春","id":"bb8ca1c7-0f75-4ecc-8ede-379819ad431c","originalAuthorName":"胡孟春"},{"authorName":"李忠宝","id":"de200958-4435-4191-9f47-2a3ade831d08","originalAuthorName":"李忠宝"},{"authorName":"甫跃成","id":"a7473c9e-692f-47df-9c06-494ea6ecf02c","originalAuthorName":"甫跃成"},{"authorName":"刘建","id":"1a6d5fde-eb65-4def-97da-8c3be0c0d677","originalAuthorName":"刘建"},{"authorName":"唐登攀","id":"ab952714-a286-4d3b-9283-3055ba36c58f","originalAuthorName":"唐登攀"},{"authorName":"李如荣","id":"b76933cf-194f-4bb2-9f24-0d4770393fab","originalAuthorName":"李如荣"},{"authorName":"王文川","id":"9dc213f6-449a-4fe2-a4a9-6fd0e10bf6a4","originalAuthorName":"王文川"},{"authorName":"黄雁","id":"4ad3fd10-caa7-42aa-8109-b1178fb2e98d","originalAuthorName":"黄雁"},{"authorName":"陈力雄","id":"1e2c3629-6201-40f6-b7f6-0b63657dc735","originalAuthorName":"陈力雄"}],"doi":"","fpage":"597","id":"8e591131-fea3-44b3-b080-6ed245425d0d","issue":"3","journal":{"abbrevTitle":"RGJTXB","coverImgSrc":"journal/img/cover/RGJTXB.jpg","id":"57","issnPpub":"1000-985X","publisherId":"RGJTXB","title":"人工晶体学报"},"keywords":[{"id":"2880834a-1581-4851-a5df-5d89477fe668","keyword":"辐射探测","originalKeyword":"辐射探测"},{"id":"a11038bf-ca41-4ab7-86ce-c531c24a7b36","keyword":"无机闪烁体","originalKeyword":"无机闪烁体"},{"id":"99231f59-ec1b-4eb6-bb2c-8fabbe23e9c2","keyword":"Yb∶YAG","originalKeyword":"Yb∶YAG"},{"id":"9eebf233-7117-4683-9be7-0a3934ed6da1","keyword":"辐照损伤","originalKeyword":"辐照损伤"},{"id":"bdefc3cc-d673-4265-9fda-8e99d930b90e","keyword":"强光一号","originalKeyword":"强光一号"}],"language":"zh","publisherId":"rgjtxb98201603006","title":"强辐射对Yb∶YAG超快无机闪烁探测器灵敏度影响的实验测量","volume":"45","year":"2016"},{"abstractinfo":"在应用林尼克结构干涉测量系统进行测量时,发现系统存在一个近似为二次曲面的测量误差.根据光学干涉系统测量原理,分别对林尼克结构干涉测量系统的相移器误差、摄像机误差和光学系统误差进行了分析,确定光学系统误差是干涉测量系统的主要误差源,其中显微物镜焦点轴向误差是产生系统测量误差曲面的主要原因.以平面为实验测量样件,应用测量系统对参考光臂显微物镜的不同轴向位置进行了测量,通过分析测量结果验证了焦点轴向误差对系统测量误差的影响,并与理论结果进行了比较.","authors":[{"authorName":"王海珊","id":"74103e34-67a9-4b9a-847b-0db32514eb6c","originalAuthorName":"王海珊"},{"authorName":"史铁林","id":"57a9b6e7-85ce-4dbf-bd25-13dc9928f56d","originalAuthorName":"史铁林"},{"authorName":"刘世元","id":"c2f5f09b-8556-4715-886f-4c5ee48b390c","originalAuthorName":"刘世元"},{"authorName":"冯奎景","id":"68a1496a-7158-49b3-8692-f4da9daa3c94","originalAuthorName":"冯奎景"},{"authorName":"廖广兰","id":"2d8020a9-b19d-4bff-b343-cbb939cfd41d","originalAuthorName":"廖广兰"}],"doi":"10.3969/j.issn.1007-4252.2008.01.032","fpage":"143","id":"1bb2db10-1f1a-40c4-ab98-1fd282cfc03f","issue":"1","journal":{"abbrevTitle":"GNCLYQJXB","coverImgSrc":"journal/img/cover/GNCLYQJXB.jpg","id":"34","issnPpub":"1007-4252","publisherId":"GNCLYQJXB","title":"功能材料与器件学报 "},"keywords":[{"id":"07904a58-ff52-4e71-8079-38293d28c011","keyword":"林尼克结构干涉测量系统","originalKeyword":"林尼克结构干涉测量系统"},{"id":"046b02b0-9fb4-4f8f-9c03-da5e4c8e668f","keyword":"系统测量误差","originalKeyword":"系统测量误差"},{"id":"d1666d9d-4e3a-40ee-8f1e-b10f2f9a45bd","keyword":"焦点轴向误差","originalKeyword":"焦点轴向误差"},{"id":"ac6e7616-d438-46cb-aeaa-b0803dabca7f","keyword":"相移器误差","originalKeyword":"相移器误差"},{"id":"b8771dbd-dfc5-4fb6-8229-bd058c68008c","keyword":"摄像机误差","originalKeyword":"摄像机误差"}],"language":"zh","publisherId":"gnclyqjxb200801032","title":"林尼克结构干涉测量系统误差分析","volume":"14","year":"2008"},{"abstractinfo":"介绍了兰州重离子加速器冷却储存环(HIRFL-CSR)积分磁场测量系统以及积分测量的基本原理和数据处理方法,对测量结果的分析表明整个系统运行可靠稳定,可用于CSR磁铁的积分测量.","authors":[{"authorName":"熊慧","id":"d8c55fbe-cccd-4222-884d-61e1b0dd43be","originalAuthorName":"熊慧"},{"authorName":"何源","id":"6e0f0056-5ad4-4a4d-b51a-c4715a395d0e","originalAuthorName":"何源"},{"authorName":"袁平","id":"c8d8476a-8d72-494d-8672-bfd9df699f9c","originalAuthorName":"袁平"},{"authorName":"韩少斐","id":"b3ddf77d-557b-49f4-a153-b74d59242024","originalAuthorName":"韩少斐"},{"authorName":"刘维军","id":"90609511-6c91-47e7-86b0-4da3a41fb20c","originalAuthorName":"刘维军"}],"doi":"10.3969/j.issn.1007-4627.2003.01.006","fpage":"34","id":"8b4dfcc4-f0e3-4732-8e26-ae4d444fb43e","issue":"1","journal":{"abbrevTitle":"YZHWLPL","coverImgSrc":"journal/img/cover/YZHWLPL.jpg","id":"78","issnPpub":"1007-4627","publisherId":"YZHWLPL","title":"原子核物理评论 "},"keywords":[{"id":"12cd50b0-856b-4810-abb9-0e7d6bcd9c9f","keyword":"积分磁场测量","originalKeyword":"积分磁场测量"},{"id":"a325cebb-7d9b-4d81-a71b-c18b49abe5ac","keyword":"磁场分布","originalKeyword":"磁场分布"},{"id":"9ade8e3e-2e5b-4172-8a94-80f7be304574","keyword":"重复性","originalKeyword":"重复性"}],"language":"zh","publisherId":"yzhwlpl200301006","title":"CSR二极磁铁积分磁场测量系统","volume":"20","year":"2003"},{"abstractinfo":"为了检验环境风洞浓度场测量系统的可行性和可靠性,以及对所设计的环境风洞浓度场测量系统的误差进行分析和研究,本文发展了一种通过定量加浓的方法来检验该测量系统.检验试验是在水中加入标准粒子,利用加入粒子的浓度不同来进行测量.试验结果表明对于所提出的基于数字图像的相对浓度场测量方法正确,设计的浓度场测量系统可行、合理.","authors":[{"authorName":"程云章","id":"e9d7c97f-1906-4b0d-9fad-67c62c8bcf7d","originalAuthorName":"程云章"},{"authorName":"刘涛","id":"86d6422a-965b-4158-88da-ac86f408c437","originalAuthorName":"刘涛"},{"authorName":"卢曦","id":"4c1834b8-bae9-4f49-a84d-ce2a9d671a61","originalAuthorName":"卢曦"},{"authorName":"吴文权","id":"15b74618-d619-4a57-bf2a-88fe64d22c42","originalAuthorName":"吴文权"}],"doi":"","fpage":"117","id":"919e2612-523d-4788-bff7-d822ba5d6596","issue":"z1","journal":{"abbrevTitle":"GCRWLXB","coverImgSrc":"journal/img/cover/GCRWLXB.jpg","id":"32","issnPpub":"0253-231X","publisherId":"GCRWLXB","title":"工程热物理学报 "},"keywords":[{"id":"26b44b91-c7e6-4209-8375-dd72e911966f","keyword":"浓度场测量系统","originalKeyword":"浓度场测量系统"},{"id":"06952a6a-2e92-4a8b-a4e6-929b3630f939","keyword":"检验试验","originalKeyword":"检验试验"},{"id":"8552cbbb-10b0-4ccf-b554-ea0232d7d4e8","keyword":"试验方法","originalKeyword":"试验方法"},{"id":"bf5e311a-2c58-4479-bca6-9af912fda5d5","keyword":"标准粒子","originalKeyword":"标准粒子"}],"language":"zh","publisherId":"gcrwlxb2006z1031","title":"环境风洞浓度场测量系统的检验试验","volume":"27","year":"2006"},{"abstractinfo":"本文主要介绍了按照目前国际上制定的超导薄膜表面阻抗Rs标准测量方案(IEC/TC90)设计并制造的Rs标准测量系统,对实验过程中系统的细节作了改进,测试精度及可靠性作了分析,实验及结果证明该标准的可行性,同时说明了我们的测试系统符合国际超导薄膜表面阻抗Rs标准测量的要求.","authors":[{"authorName":"许华嵘","id":"2091f484-5c3d-4795-ae10-0bad221d2d05","originalAuthorName":"许华嵘"},{"authorName":"吴立勇","id":"3d4f874a-b156-4e36-933c-1ee59140c566","originalAuthorName":"吴立勇"},{"authorName":"施建荣","id":"1a576411-3e21-4366-b46a-233e0c9b7cf1","originalAuthorName":"施建荣"},{"authorName":"曹春海","id":"ad18553d-f0f7-46f8-9a27-9e7cee0c490f","originalAuthorName":"曹春海"},{"authorName":"蔡卫星","id":"df026efb-1e2a-47af-99c2-45a3cc558211","originalAuthorName":"蔡卫星"},{"authorName":"孙国柱","id":"b637374e-ffae-428d-8192-d30d71c9fbd5","originalAuthorName":"孙国柱"},{"authorName":"王相元","id":"d1775a54-58fb-4ceb-9030-13f511eb01d0","originalAuthorName":"王相元"},{"authorName":"钱鉴","id":"16e81962-0a64-4eeb-b2d4-5bc1c294fc76","originalAuthorName":"钱鉴"},{"authorName":"杨森祖","id":"585de9ff-8769-4cf8-8dbc-6a237d853641","originalAuthorName":"杨森祖"},{"authorName":"吉争鸣","id":"af2a7e98-79f1-4428-bb69-199ba128cbe7","originalAuthorName":"吉争鸣"},{"authorName":"程其恒","id":"61ed7c2c-050f-49f3-bfa2-930f35053af8","originalAuthorName":"程其恒"},{"authorName":"吴培亨","id":"c216e90a-8b26-4f23-9726-f93e7bf3ae72","originalAuthorName":"吴培亨"}],"doi":"10.3969/j.issn.1000-3258.2002.04.006","fpage":"268","id":"c8cfcd89-cf56-4966-8ab8-cd21ca5871c8","issue":"4","journal":{"abbrevTitle":"DWWLXB","coverImgSrc":"journal/img/cover/DWWLXB.jpg","id":"19","issnPpub":"1000-3258","publisherId":"DWWLXB","title":"低温物理学报 "},"keywords":[{"id":"24ee17ef-a21b-412b-ab25-1b5ec9f12a70","keyword":"","originalKeyword":""}],"language":"zh","publisherId":"dwwlxb200204006","title":"Rs标准测量系统的研究及其误差讨论","volume":"24","year":"2002"}],"totalpage":2435,"totalrecord":24342}